Gopinath Ranganathan

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Singapore, SG

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Patents Grantslast 30 patents

Information Patent Grant
Analysis of electro-optic waveforms
- Patent number 11,143,700
- Issue date Oct 12, 2021
- Advanced Micro Devices, Inc.
- Venkat Krishnan Ravikumar
- G01 - MEASURING TESTING
Information Patent Grant
Probe placement for laser probing system
- Patent number 10,768,225
- Issue date Sep 8, 2020
- Advanced Micro Devices, Inc.
- Venkat Krishnan Ravikumar
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ANALYSIS OF ELECTRO-OPTIC WAVEFORMS
- Publication number 20210088582
- Publication date Mar 25, 2021
- ADVANCED MICRO DEVICES, INC.
- Venkat Krishnan Ravikumar
- G01 - MEASURING TESTING
Information Patent Application
PROBE PLACEMENT FOR LASER PROBING SYSTEM
- Publication number 20200284837
- Publication date Sep 10, 2020
- ADVANCED MICRO DEVICES, INC.
- Venkat Krishnan Ravikumar
- G01 - MEASURING TESTING