Gordon Abbott

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Pleasanton, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for using electrical information for a device b...
- Patent number 8,194,968
- Issue date Jun 5, 2012
- KLA-Tencor Corp.
- Allen Park
- G01 - MEASURING TESTING
Information Patent Grant
Use of design information and defect image information in defect cl...
- Patent number 8,175,373
- Issue date May 8, 2012
- KLA-Tencor Corporation
- Gordon Abbott
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Determining locations on a wafer to be reviewed during defect review
- Patent number 7,904,845
- Issue date Mar 8, 2011
- KLA-Tencor Corp.
- Christophe Fouquet
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHODS FOR REAL-TIME THREE-DIMENSIONAL SEM IMAGING A...
- Publication number 20120223227
- Publication date Sep 6, 2012
- Chien-Huei CHEN
- G01 - MEASURING TESTING
Information Patent Application
USE OF DESIGN INFORMATION AND DEFECT IMAGE INFORMATION IN DEFECT CL...
- Publication number 20100208979
- Publication date Aug 19, 2010
- KLA-Tencor Corporation
- Gordon Abbott
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND SYSTEMS FOR USING ELECTRICAL INFORMATION FOR A DEVICE B...
- Publication number 20080167829
- Publication date Jul 10, 2008
- Allen Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS, DESIGNS, DEFECT REVIEW TOOLS, AND SYSTEMS FOR DETERMINING...
- Publication number 20080163140
- Publication date Jul 3, 2008
- Christophe Fouquet
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY