Gordon C. Angel

Person

Salem, MA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Techniques for plasma injection
- Patent number 7,723,707
- Issue date May 25, 2010
- Varian Semiconductor Equipment Associates, Inc.
- Victor M. Benveniste
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Techniques for confining electrons in an ion implanter
- Patent number 7,655,922
- Issue date Feb 2, 2010
- Varian Semiconductor Equipment Associates, Inc.
- Donna L. Smatlak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Technique for implementing a variable aperture lens in an ion impla...
- Patent number 7,279,687
- Issue date Oct 9, 2007
- Varian Semiconductor Equipment Associates, Inc.
- Gordon C. Angel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam neutral detection
- Patent number 7,250,617
- Issue date Jul 31, 2007
- Varian Semiconductor Equipment Associates, Inc.
- Anthony Renau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam measurement apparatus and method
- Patent number 7,170,067
- Issue date Jan 30, 2007
- Varian Semiconductor Equipment Associates, Inc.
- Anthony Renau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and methods for two-dimensional ion beam profiling
- Patent number 7,109,499
- Issue date Sep 19, 2006
- Varian Semiconductor Equipment Associates, Inc.
- Gordon C. Angel
- G01 - MEASURING TESTING
Information Patent Grant
Wafer-scanning ion implanter having fast beam deflection apparatus...
- Patent number 7,005,657
- Issue date Feb 28, 2006
- Varian Semiconductor Equipment Associates, Inc.
- Russell J. Low
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
TECHNIQUES FOR PLASMA INJECTION
- Publication number 20090026390
- Publication date Jan 29, 2009
- Varian Semiconductor Equipment Associates, Inc.
- Victor M. Benveniste
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TECHNIQUES FOR CONFINING ELECTRONS IN AN ION IMPLANTER
- Publication number 20080135775
- Publication date Jun 12, 2008
- Varian Semiconductor Equipment Associates, Inc.
- Donna L. Smatlak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Technique for implementing a variable aperture lens in an ion impla...
- Publication number 20070045557
- Publication date Mar 1, 2007
- Gordon C. Angel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion beam measurement apparatus and method
- Publication number 20060192134
- Publication date Aug 31, 2006
- Anthony Renau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and methods for two-dimensional ion beam profiling
- Publication number 20060097195
- Publication date May 11, 2006
- Varian Semiconductor Equipment Associates, Inc.
- Gordon C. Angel
- G01 - MEASURING TESTING
Information Patent Application
Ion beam neutral detection
- Publication number 20050178981
- Publication date Aug 18, 2005
- Anthony Renau
- H01 - BASIC ELECTRIC ELEMENTS

Gordon C. Angel

Person

Patents Grantslast 30 patents

Techniques for plasma injection

Techniques for confining electrons in an ion implanter

Technique for implementing a variable aperture lens in an ion impla...

Ion beam neutral detection

Ion beam measurement apparatus and method

Apparatus and methods for two-dimensional ion beam profiling

Wafer-scanning ion implanter having fast beam deflection apparatus...

Patents Applicationslast 30 patents

TECHNIQUES FOR PLASMA INJECTION

TECHNIQUES FOR CONFINING ELECTRONS IN AN ION IMPLANTER

Technique for implementing a variable aperture lens in an ion impla...

Ion beam measurement apparatus and method

Apparatus and methods for two-dimensional ion beam profiling

Ion beam neutral detection