Gorou Kitsukawa

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Kisarazu, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor integrated circuit device
- Patent number 8,629,481
- Issue date Jan 14, 2014
- Renesas Electronics Corporation
- Asao Nishimura
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit device with a fuse circuit
- Patent number 7,910,960
- Issue date Mar 22, 2011
- Renesas Electronics Corporation
- Asao Nishimura
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit device and manufacture thereof
- Patent number 7,910,922
- Issue date Mar 22, 2011
- Renesas Electronics Corporation
- Asao Nishimura
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit device and manufacture thereof
- Patent number 7,550,763
- Issue date Jun 23, 2009
- Renesas Technology Corp.
- Asao Nishimura
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit device having particular testing p...
- Patent number 7,247,879
- Issue date Jul 24, 2007
- Renesas Technology Corp.
- Asao Nishimura
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit device having bump electrodes for...
- Patent number 6,831,294
- Issue date Dec 14, 2004
- Renesas Technology Corp.
- Asao Nishimura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND MANUFACTURE THEREOF
- Publication number 20110140185
- Publication date Jun 16, 2011
- RENESAS ELECTRONICS CORPORATION
- Asao Nishimura
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND MANUFACTURE THEREOF
- Publication number 20100301334
- Publication date Dec 2, 2010
- RENESAS ELECTRONICS CORPORATION
- Asao Nishimura
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND MANUFACTURE THEREOF
- Publication number 20090230448
- Publication date Sep 17, 2009
- Renesas Technology Corp.
- Asao Nishimura
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor integrated circuit device and manufacture thereof
- Publication number 20070241330
- Publication date Oct 18, 2007
- Asao Nishimura
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor integrated circuit device and manufacture thereof
- Publication number 20040232446
- Publication date Nov 25, 2004
- RENESAS TECHNOLOGY CORPORATION
- Asao Nishimura
- G01 - MEASURING TESTING