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Gousheng Tan
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Waukesha, WI, US
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last 30 patents
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Patent Grant
Multi-slice and multi-angle MRI using fast spin echo acquisition
Patent number
6,134,464
Issue date
Oct 17, 2000
General Electric Company
Gousheng Tan
G01 - MEASURING TESTING
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Patent Grant
Method for reducing Maxwell term artifacts in fast spin echo MR images
Patent number
6,011,392
Issue date
Jan 4, 2000
General Electric Company
Xiaohong Zhou
G01 - MEASURING TESTING
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Patent Grant
Method for reducing Maxwell term artifacts in fast spin echo MR images
Patent number
6,008,647
Issue date
Dec 28, 1999
General Electric Company
Xiaohang Zhou
G01 - MEASURING TESTING