Grady L. Giles

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Repairable latch array
- Patent number 12,100,464
- Issue date Sep 24, 2024
- Advanced Micro Devices, Inc.
- Joel Thornton Irby
- G11 - INFORMATION STORAGE
Information Patent Grant
Repairable latch array
- Patent number 11,657,892
- Issue date May 23, 2023
- Advanced Micro Devices, Inc.
- Joel Thornton Irby
- G11 - INFORMATION STORAGE
Information Patent Grant
Power supply monitor for detecting faults during scan testing
- Patent number 9,194,914
- Issue date Nov 24, 2015
- Advanced Micro Devices, Inc.
- Stephen V. Kosonocky
- G01 - MEASURING TESTING
Information Patent Grant
Test circuit having scan warm-up
- Patent number 9,046,574
- Issue date Jun 2, 2015
- Advanced Micro Devices, Inc.
- Grady L. Giles
- G01 - MEASURING TESTING
Information Patent Grant
Test access mechanism for multi-core processor or other integrated...
- Patent number 8,103,924
- Issue date Jan 24, 2012
- GLOBALFOUNDRIES Inc.
- Grady L. Giles
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing embedded memory read paths
- Patent number 7,925,937
- Issue date Apr 12, 2011
- Advanced Micro Devices, Inc.
- Joel T. Irby
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for verifying and characterizing data retentio...
- Patent number 6,272,588
- Issue date Aug 7, 2001
- Motorola Inc.
- Thomas Kevin Johnston
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for leveraging history bits to optimize memory...
- Patent number 6,167,484
- Issue date Dec 26, 2000
- Motorola, Inc.
- John Mark Boyer
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for testing an integrated memory device
- Patent number 6,085,334
- Issue date Jul 4, 2000
- Motorola, Inc.
- Grady Lawrence Giles
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wrapper cell architecture for path delay testing of embedded core m...
- Patent number 5,889,788
- Issue date Mar 30, 1999
- Motorola, Inc.
- Matthew D. Pressly
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scan based testing of an integrated circuit for compliance with tim...
- Patent number 5,812,561
- Issue date Sep 22, 1998
- Motorola, Inc.
- Grady L. Giles
- G01 - MEASURING TESTING
Information Patent Grant
Timing apparatus and timing method for wrapper cell speed path test...
- Patent number 5,774,476
- Issue date Jun 30, 1998
- Motorola, Inc.
- Matthew D. Pressly
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for shifting data in an array of storage eleme...
- Patent number 5,369,752
- Issue date Nov 29, 1994
- Motorola, Inc.
- Grady L. Giles
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for indicating a duplication of entries in a c...
- Patent number 5,220,526
- Issue date Jun 15, 1993
- Motorola, Inc.
- Grady L. Giles
- G11 - INFORMATION STORAGE
Information Patent Grant
Toggle-free scan flip-flop
- Patent number 5,015,875
- Issue date May 14, 1991
- Motorola, Inc.
- Grady L. Giles
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Accelerated test apparatus and support logic for a content addressa...
- Patent number 4,680,760
- Issue date Jul 14, 1987
- Motorola, Inc.
- Grady L. Giles
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
REPAIRABLE LATCH ARRAY
- Publication number 20230253063
- Publication date Aug 10, 2023
- ADVANCED MICRO DEVICES, INC.
- JOEL THORNTON IRBY
- G11 - INFORMATION STORAGE
Information Patent Application
POWER SUPPLY MONITOR FOR DETECTING FAULTS DURING SCAN TESTING
- Publication number 20150026531
- Publication date Jan 22, 2015
- Advanced Micro Devices, Inc.
- Stephen V. Kosonocky
- G01 - MEASURING TESTING
Information Patent Application
TEST CIRCUIT HAVING SCAN WARM-UP
- Publication number 20140149813
- Publication date May 29, 2014
- Advanced Micro Devices, Inc.
- Grady L. Giles
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS TO FACILITATE BUILT-IN SELF-TEST DATA COLLECTION
- Publication number 20120159274
- Publication date Jun 21, 2012
- Kedarnath J. Balakrishnan
- G01 - MEASURING TESTING
Information Patent Application
TEST ACCESS MECHANISM FOR MULTI-CORE PROCESSOR OR OTHER INTEGRATED...
- Publication number 20090193303
- Publication date Jul 30, 2009
- Grady L. Giles
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS FOR TESTING EMBEDDED MEMORY READ PATHS
- Publication number 20090177934
- Publication date Jul 9, 2009
- Joel T. Irby
- G11 - INFORMATION STORAGE

Grady L. Giles

Person

Patents Grantslast 30 patents

Repairable latch array

Repairable latch array

Power supply monitor for detecting faults during scan testing

Test circuit having scan warm-up

Test access mechanism for multi-core processor or other integrated...

Apparatus for testing embedded memory read paths

Method and apparatus for verifying and characterizing data retentio...

Method and apparatus for leveraging history bits to optimize memory...

Method and apparatus for testing an integrated memory device

Wrapper cell architecture for path delay testing of embedded core m...

Scan based testing of an integrated circuit for compliance with tim...

Timing apparatus and timing method for wrapper cell speed path test...

Method and apparatus for shifting data in an array of storage eleme...

Method and apparatus for indicating a duplication of entries in a c...

Toggle-free scan flip-flop

Accelerated test apparatus and support logic for a content addressa...

Patents Applicationslast 30 patents

REPAIRABLE LATCH ARRAY

POWER SUPPLY MONITOR FOR DETECTING FAULTS DURING SCAN TESTING

TEST CIRCUIT HAVING SCAN WARM-UP

APPARATUS TO FACILITATE BUILT-IN SELF-TEST DATA COLLECTION

TEST ACCESS MECHANISM FOR MULTI-CORE PROCESSOR OR OTHER INTEGRATED...

APPARATUS FOR TESTING EMBEDDED MEMORY READ PATHS