Graham Michael Lynch

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Singapore, SG

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Patents Grantslast 30 patents

Information Patent Grant
Surface height determination of transparent film
- Patent number 10,557,803
- Issue date Feb 11, 2020
- Onto Innovation Inc.
- Graham M. Lynch
- G01 - MEASURING TESTING
Information Patent Grant
Detecting defects on a wafer
- Patent number 9,355,208
- Issue date May 31, 2016
- KLA-Tencor Corp.
- Eugene Shifrin
- G01 - MEASURING TESTING
Information Patent Grant
Setting up a wafer inspection process using programmed defects
- Patent number 9,347,862
- Issue date May 24, 2016
- KLA-Tencor Corp.
- Graham Michael Lynch
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SURFACE HEIGHT DETERMINATION OF TRANSPARENT FILM
- Publication number 20190391088
- Publication date Dec 26, 2019
- Nanometrics Incorporated
- Graham M. LYNCH
- G01 - MEASURING TESTING
Information Patent Application
Setting Up a Wafer Inspection Process Using Programmed Defects
- Publication number 20150042978
- Publication date Feb 12, 2015
- KLA-Tencor Corporation
- Graham Michael Lynch
- G01 - MEASURING TESTING
Information Patent Application
Methods and Systems for Detecting Repeating Defects on Semiconducto...
- Publication number 20150012900
- Publication date Jan 8, 2015
- KLA-Tencor Corporation
- Eugene Shifrin
- G01 - MEASURING TESTING