Grant McNeil

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Williston, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
Test mode for IPP current measurement for wordline defect detection
- Patent number 7,257,038
- Issue date Aug 14, 2007
- Infineon Technologies AG
- Michael A. Killian
- G11 - INFORMATION STORAGE
Information Patent Grant
Electro-static discharge protection circuit and method for making t...
- Patent number 6,943,396
- Issue date Sep 13, 2005
- Infineon Technologies AG
- Grant McNeil
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED CIRCUIT INCLUDING DECOUPLING CAPACITORS THAT CAN BE DISA...
- Publication number 20090040857
- Publication date Feb 12, 2009
- Grant McNeil
- G11 - INFORMATION STORAGE
Information Patent Application
Test mode for IPP current measurement for wordline defect detection
- Publication number 20070153596
- Publication date Jul 5, 2007
- Michael A. Kilian
- G11 - INFORMATION STORAGE
Information Patent Application
Electro-static discharge protection circuit and method for making t...
- Publication number 20040256675
- Publication date Dec 23, 2004
- Infineon Technologies North America Corp.
- Grant McNeil
- H01 - BASIC ELECTRIC ELEMENTS