Greg C. Felix

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for cyclic error correction in a heterodyne int...
- Patent number 11,236,985
- Issue date Feb 1, 2022
- Keysight Technologies, Inc.
- Greg C. Felix
- G01 - MEASURING TESTING
Information Patent Grant
Separated beams displacement measurement with a grating
- Patent number 11,156,449
- Issue date Oct 26, 2021
- Keysight Technologies, Inc.
- Greg C. Felix
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer with Double Polarizing Beam Splitter
- Patent number 7,652,771
- Issue date Jan 26, 2010
- Agilent Technologies, Inc.
- Greg C Felix
- G01 - MEASURING TESTING
Information Patent Grant
High efficiency beam distribution with independent wavefront correc...
- Patent number 7,280,275
- Issue date Oct 9, 2007
- Agilent Technologies, Inc.
- W. Clay Schluchter
- G02 - OPTICS
Information Patent Grant
Differential interferometers creating desired beam patterns
- Patent number 7,212,290
- Issue date May 1, 2007
- Agilent Technologies, Inc.
- Kevin R. Fine
- G01 - MEASURING TESTING
Information Patent Grant
Compact beam re-tracing optics to eliminate beam walk-off in an int...
- Patent number 6,806,960
- Issue date Oct 19, 2004
- Agilent Technologies, Inc.
- Kerry D. Bagwell
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR CYCLIC ERROR CORRECTION IN A HETERODYNE INT...
- Publication number 20210148691
- Publication date May 20, 2021
- KEYSIGHT TECHNOLOGIES, INC.
- Greg C. Felix
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR CYCLIC ERROR CORRECTION IN A HETERODYNE INT...
- Publication number 20190113329
- Publication date Apr 18, 2019
- KEYSIGHT TECHNOLOGIES, INC.
- Greg C. Felix
- G01 - MEASURING TESTING
Information Patent Application
SEPARATED BEAMS DISPLACEMENT MEASUREMENT WITH A GRATING
- Publication number 20170219334
- Publication date Aug 3, 2017
- Keysight Technologies, Inc.
- Greg C. Felix
- G01 - MEASURING TESTING
Information Patent Application
Interferometer with Double Polarizing Beam Splitter
- Publication number 20090109442
- Publication date Apr 30, 2009
- Greg C. Felix
- G02 - OPTICS
Information Patent Application
Optical interferometer
- Publication number 20070109552
- Publication date May 17, 2007
- Greg C. Felix
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for attaching microdisplays and other sensitiv...
- Publication number 20070035846
- Publication date Feb 15, 2007
- Scott Detro and Greg Felix
- Scott Detro
- G02 - OPTICS
Information Patent Application
High efficiency beam distribution with independent wavefront correc...
- Publication number 20070024976
- Publication date Feb 1, 2007
- W. Clay Schluchter
- G02 - OPTICS
Information Patent Application
Differential interferometers creating desired beam patterns
- Publication number 20060039005
- Publication date Feb 23, 2006
- Kevin R. Fine
- G01 - MEASURING TESTING
Information Patent Application
Compact beam re-tracing optics to eliminate beam walk-off in an int...
- Publication number 20030197870
- Publication date Oct 23, 2003
- Kerry D. Bagwell
- G01 - MEASURING TESTING

Greg C. Felix

Person

Patents Grantslast 30 patents

Systems and methods for cyclic error correction in a heterodyne int...

Separated beams displacement measurement with a grating

Interferometer with Double Polarizing Beam Splitter

High efficiency beam distribution with independent wavefront correc...

Differential interferometers creating desired beam patterns

Compact beam re-tracing optics to eliminate beam walk-off in an int...

Patents Applicationslast 30 patents

SYSTEMS AND METHODS FOR CYCLIC ERROR CORRECTION IN A HETERODYNE INT...

SYSTEMS AND METHODS FOR CYCLIC ERROR CORRECTION IN A HETERODYNE INT...

SEPARATED BEAMS DISPLACEMENT MEASUREMENT WITH A GRATING

Interferometer with Double Polarizing Beam Splitter

Optical interferometer

Method and apparatus for attaching microdisplays and other sensitiv...

High efficiency beam distribution with independent wavefront correc...

Differential interferometers creating desired beam patterns

Compact beam re-tracing optics to eliminate beam walk-off in an int...