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Greg Goodwin
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Austin, TX, US
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last 30 patents
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Patent Grant
Charge storage device for detecting alpha particles
Patent number
8,748,800
Issue date
Jun 10, 2014
Spansion LLC
Timothy Z. Hossain
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for detecting particles with a semiconductor device
Patent number
8,436,289
Issue date
May 7, 2013
Spansion LLC
Timothy Z. Hossain
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for control of photoresist plasma removal
Patent number
6,689,521
Issue date
Feb 10, 2004
Advanced Micro Devices, Inc.
Greg Goodwin
B08 - CLEANING
Information
Patent Grant
Method and apparatus for performing final critical dimension control
Patent number
6,625,512
Issue date
Sep 23, 2003
Advanced Micro Devices, Inc.
Greg Goodwin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Die-based in-fab process monitoring and analysis system for semicon...
Patent number
6,368,884
Issue date
Apr 9, 2002
Advanced Micro Devices, Inc.
Greg Goodwin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for controlling photolithography parameters ba...
Patent number
6,259,521
Issue date
Jul 10, 2001
Advanced Micro Devices, Inc.
Michael Miller
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
Information
Patent Application
SYSTEM AND METHOD FOR DETECTING PARTICLES WITH A SEMICONDUCTOR DEVICE
Publication number
20130193537
Publication date
Aug 1, 2013
SPANSION LLC
Timothy Z. HOSSAIN
H01 - BASIC ELECTRIC ELEMENTS