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Gregg A. Norris
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Rockport, MA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Ion beam current uniformity monitor, ion implanter and related method
Patent number
7,663,125
Issue date
Feb 16, 2010
Varian Semiconductor Equipment Associates, Inc.
William G. Callahan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Automated faraday sensor test system
Patent number
7,564,048
Issue date
Jul 21, 2009
Varian Semiconductor E1quipment Associates, Inc.
Joseph P. Dzengeleski
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods and apparatus for beam density measurement in two dimensions
Patent number
7,453,070
Issue date
Nov 18, 2008
Varian Semiconductor Associates, Inc.
Atul Gupta
G01 - MEASURING TESTING
Information
Patent Grant
Ion beam implant current, spot width and position tuning
Patent number
7,442,944
Issue date
Oct 28, 2008
Varian Semiconductor Equipment Associates, Inc.
Shengwu Chang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Technique for uniformity tuning in an ion implanter system
Patent number
7,355,188
Issue date
Apr 8, 2008
Varian Semiconductor Equipment Associates, Inc.
Joseph C. Olson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Technique for high-efficiency ion implantation
Patent number
7,176,470
Issue date
Feb 13, 2007
Varian Semiconductor Equipment Associates, Inc.
Morgan D. Evans
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
HDLC Data Reception Using Signal Pulse Widths
Publication number
20240204762
Publication date
Jun 20, 2024
Applied Materials, Inc.
Roshan K. Barua
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Automated faraday sensor test system
Publication number
20080073551
Publication date
Mar 27, 2008
Varian Semiconductor Equipment Associates, Inc.
Joseph P. Dzengeleski
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION BEAM CURRENT UNIFORMITY MONITOR, ION IMPLANTER AND RELATED METHOD
Publication number
20080073584
Publication date
Mar 27, 2008
William G. Callahan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Methods and apparatus for beam density measurement in two dimensions
Publication number
20080073550
Publication date
Mar 27, 2008
Varian Semiconductor Equipment Associates, Inc.
Atul Gupta
G01 - MEASURING TESTING
Information
Patent Application
Technique for uniformity tuning in an ion implanter system
Publication number
20060284114
Publication date
Dec 21, 2006
Varian Semiconductor Equipment Associates, Inc.
Joseph C. Olson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Ion beam implant current, spot width and position tuning
Publication number
20060076510
Publication date
Apr 13, 2006
Shengwu Chang
H01 - BASIC ELECTRIC ELEMENTS