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Gregor Overney
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Sunnyvale, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Wideband isolation directed by ion mobility separation for analyzin...
Patent number
10,267,765
Issue date
Apr 23, 2019
Agilent Technologies, Inc.
Jun Wang
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for surface desorption ionization by charged p...
Patent number
8,129,677
Issue date
Mar 6, 2012
Agilent Technologies, Inc.
Jean-Luc Truche
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Time of flight mass spectrometry method and apparatus
Patent number
7,977,626
Issue date
Jul 12, 2011
Agilent Technologies, Inc.
August Jon Hidalgo
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for surface desorption ionization by charged p...
Patent number
7,723,678
Issue date
May 25, 2010
Agilent Technologies, Inc.
Jean-Luc Truche
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus and method for MALDI source control with external image c...
Patent number
7,550,720
Issue date
Jun 23, 2009
Agilent Technologies, Inc.
Gregor T. Overney
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Real-time analysis of mass spectrometry data for identifying peptid...
Patent number
7,498,568
Issue date
Mar 3, 2009
Agilent Technologies, Inc.
Gregor T. Overney
G01 - MEASURING TESTING
Information
Patent Grant
MALDI sample plate imaging workstation
Patent number
7,495,231
Issue date
Feb 24, 2009
Agilent Technologies, Inc.
Jean-Luc Truche
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multichannel rapid sampling of chromatographic peaks by tandem mass...
Patent number
7,479,629
Issue date
Jan 20, 2009
Agilent Technologies, Inc.
Gregor Overney
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion source sample plate illumination system
Patent number
7,435,951
Issue date
Oct 14, 2008
Agilent Technologies, Inc.
Jean-Luc Truche
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus for combined laser focusing and spot imaging for MALDI
Patent number
7,423,260
Issue date
Sep 9, 2008
Agilent Technologies, Inc.
Gregor Overney
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
User customizable plate handling for MALDI mass spectrometry
Patent number
7,411,183
Issue date
Aug 12, 2008
Agilent Technologies, Inc.
Gregor T. Overney
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Increased depth of field for high resolution imaging for a matrix-b...
Patent number
7,365,310
Issue date
Apr 29, 2008
Agilent Technologies, Inc.
Jean-Luc Truche
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus and method for MALDI source control with external image c...
Patent number
7,291,835
Issue date
Nov 6, 2007
Agilent Technologies, Inc.
Gregor T. Overney
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Compensating for a measured variation in length of a flight tube of...
Patent number
7,183,543
Issue date
Feb 27, 2007
Agilent Technologies, Inc.
Gregor Overney
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus and method for MALDI source control with external image c...
Patent number
7,145,135
Issue date
Dec 5, 2006
Agilent Technologies, Inc.
Gregor T. Overney
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
User customizable plate handling for MALDI mass spectrometry
Patent number
7,138,625
Issue date
Nov 21, 2006
Agilent Technologies, Inc.
Gregor T. Overney
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrometer with flexible user interface
Patent number
7,129,481
Issue date
Oct 31, 2006
Agilent Technologies, Inc.
Gregor Overney
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Deconvolution method and apparatus for analyzing compounds
Patent number
6,623,935
Issue date
Sep 23, 2003
Agilent Technologies, Inc.
Gregor T. Overney
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Deconvolution method and apparatus for analyzing compounds
Patent number
6,524,803
Issue date
Feb 25, 2003
Agilent Technologies, Inc.
Gregor T. Overney
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
WIDEBAND ISOLATION DIRECTED BY ION MOBILITY SEPARATION FOR ANALYZIN...
Publication number
20170299550
Publication date
Oct 19, 2017
Agilent Technologies, Inc.
Jun Wang
G01 - MEASURING TESTING
Information
Patent Application
System and method for analyzing contents of sample based on quality...
Publication number
20100288917
Publication date
Nov 18, 2010
AGILENT TECHNOLOGIES, INC.
Javier E. Satulovsky
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and Apparatus for Surface Desorption Ionization by Charged P...
Publication number
20100230589
Publication date
Sep 16, 2010
AGILENT TECHNOLOGIES, INC.
Jean-Luc Truche
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TIME OF FLIGHT MASS SPECTROMETRY METHOD AND APPARATUS
Publication number
20080296490
Publication date
Dec 4, 2008
Agilent Technologies, Inc.
August Jon Hidalgo
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Use of Optical Sensors for Spray Jet Diagnostics
Publication number
20080226133
Publication date
Sep 18, 2008
Jean-Luc Truche
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MULTICHANNEL RAPID SAMPLING OF CHROMATOGRAPHIC PEAKS BY TANDEM MASS...
Publication number
20080073496
Publication date
Mar 27, 2008
AGILENT TECHNOLOGIES, INC.
Gregor Overney
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and apparatus for surface desorption ionization by charged p...
Publication number
20070228271
Publication date
Oct 4, 2007
Jean-Luc Truche
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and apparatus for mass spectrometer diagnostics
Publication number
20070164205
Publication date
Jul 19, 2007
Jean Luc Truche
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Apparatus for combined laser focusing and spot imaging for MALDI
Publication number
20070102632
Publication date
May 10, 2007
Gregor Overney
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Mass spectrometer having an embedded web server
Publication number
20070102633
Publication date
May 10, 2007
Karl Knute Kresie
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Maldi sample plate imaging workstation
Publication number
20070051899
Publication date
Mar 8, 2007
Jean-Luc Truche
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Increased depth of field for high resolution imaging for a matrix-b...
Publication number
20060289734
Publication date
Dec 28, 2006
Jean-Luc Truche
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Apparatus and method for MALDI source control with external image c...
Publication number
20060284079
Publication date
Dec 21, 2006
Gregor T. Overney
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Apparatus and method for maldi source control with external image c...
Publication number
20060284078
Publication date
Dec 21, 2006
Gregor T. Overney
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Ion source sample plate illumination system
Publication number
20060278824
Publication date
Dec 14, 2006
Jean-Luc Truche
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Real-time analysis of mass spectrometry data for identifying peptid...
Publication number
20060243900
Publication date
Nov 2, 2006
Gregor T. Overney
G01 - MEASURING TESTING
Information
Patent Application
User customizable plate handling for MALDI mass spectrometry
Publication number
20050139779
Publication date
Jun 30, 2005
Gregor T. Overney
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
User customizable plate handling for MALDI mass spectrometry
Publication number
20050139778
Publication date
Jun 30, 2005
Gregor T. Overney
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Mass spectrometer with flexible user interface
Publication number
20040245992
Publication date
Dec 9, 2004
Gregor Overney
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
User customizable plate handling for MALDI mass spectrometry
Publication number
20040217278
Publication date
Nov 4, 2004
Gregor T. Overney
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Secure file verification station for ensuring data integrity
Publication number
20030188180
Publication date
Oct 2, 2003
Gregor T. Overney
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Deconvolution method and apparatus for analyzing compounds
Publication number
20030071207
Publication date
Apr 17, 2003
Gregor T. Overney
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Deconvolution method and apparatus for analyzing compounds
Publication number
20020117615
Publication date
Aug 29, 2002
Gregor T. Overney
H01 - BASIC ELECTRIC ELEMENTS