Gregory A. Dabney

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for nano probing a semiconductor chip
- Patent number 7,847,575
- Issue date Dec 7, 2010
- GLOBALFOUNDRIES Inc.
- Ronald M. Potok
- G01 - MEASURING TESTING
Information Patent Grant
Laser beam induced phenomena detection
- Patent number 6,897,664
- Issue date May 24, 2005
- Advanced Micro Devices, Inc.
- Michael Bruce
- G01 - MEASURING TESTING
Information Patent Grant
Photon beacon
- Patent number 6,833,718
- Issue date Dec 21, 2004
- Advanced Micro Devices, Inc.
- David Bethke
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optical analysis of integrated circuits
- Patent number 6,833,716
- Issue date Dec 21, 2004
- Advanced Micro Devices, Inc.
- Rama R. Goruganthu
- G01 - MEASURING TESTING
Information Patent Grant
Internal anti-reflective coating for interference reduction
- Patent number 6,410,349
- Issue date Jun 25, 2002
- Advanced Micro Devices, Inc.
- Michael R. Bruce
- G01 - MEASURING TESTING
Information Patent Grant
Analyzing an electronic circuit formed upon a frontside surface of...
- Patent number 6,107,107
- Issue date Aug 22, 2000
- Advanced Micro Devices, Inc.
- Victoria J. Bruce
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and Apparatus for Nano Probing a Semiconductor Chip
- Publication number 20100019786
- Publication date Jan 28, 2010
- Ronald M. Potok
- G01 - MEASURING TESTING