Gregory A. Dahlen

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Santa Barbara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for characterizing a probe tip
- Patent number 8,650,661
- Issue date Feb 11, 2014
- Bruker Nano, Inc.
- Gregory A. Dahlen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Sidewall tracing nanoprobes, method for making the same, and method...
- Patent number 8,245,318
- Issue date Aug 14, 2012
- The Regents of the University of California
- Sungho Jin
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Image reconstruction method
- Patent number 7,684,956
- Issue date Mar 23, 2010
- Veeco Instruments, Inc.
- Gregory A. Dahlen
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for utilizing scanning probe shape characteriza...
- Patent number 7,578,176
- Issue date Aug 25, 2009
- Veeco Metrology, Inc.
- Tianming Bao
- G01 - MEASURING TESTING
Information Patent Grant
Image reconstruction method
- Patent number 7,143,005
- Issue date Nov 28, 2006
- Veeco Instruments Inc.
- Gregory A. Dahlen
- G01 - MEASURING TESTING
Information Patent Grant
Image reconstruction method
- Patent number 6,810,354
- Issue date Oct 26, 2004
- Veeco Instruments Inc.
- Gregory A. Dahlen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and Apparatus for Characterizing a Probe Tip
- Publication number 20100313312
- Publication date Dec 9, 2010
- VEECO INSTRUMENTS INC.
- Gregory Dahlen
- G01 - MEASURING TESTING
Information Patent Application
SIDEWALL TRACING NANOPROBES, METHOD FOR MAKING THE SAME, AND METHOD...
- Publication number 20100005553
- Publication date Jan 7, 2010
- Sungho Jin
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods for utilizing scanning probe shape characteriza...
- Publication number 20080154521
- Publication date Jun 26, 2008
- Tianming Bao
- G01 - MEASURING TESTING
Information Patent Application
Image reconstruction method
- Publication number 20070208533
- Publication date Sep 6, 2007
- Gregory A. Dahlen
- G01 - MEASURING TESTING
Information Patent Application
Image reconstruction method
- Publication number 20050043917
- Publication date Feb 24, 2005
- Gregory A. Dahlen
- G01 - MEASURING TESTING