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Gregory Bazan
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Essex Junction, VT, US
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Patents Grants
last 30 patents
Information
Patent Grant
Whole wafer edge seal
Patent number
9,589,895
Issue date
Mar 7, 2017
GLOBALFOUNDRIES Inc.
Gregory Bazan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of adding fabrication monitors to integrated circuit chips
Patent number
7,620,931
Issue date
Nov 17, 2009
International Business Machines Corporation
James W. Adkisson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of adding fabrication monitors to integrated circuit chips
Patent number
7,323,278
Issue date
Jan 29, 2008
International Business Machines Corporation
James W. Adkisson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of adding fabrication monitors to integrated circuit chips
Patent number
7,240,322
Issue date
Jul 3, 2007
International Business Machines Corporation
James W. Adkisson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Designing scan chains with specific parameter sensitivities to iden...
Patent number
7,194,706
Issue date
Mar 20, 2007
International Business Machines Corporation
James W. Adkisson
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Defect diagnosis for semiconductor integrated circuits
Patent number
7,089,514
Issue date
Aug 8, 2006
International Business Machines Corporation
James W. Adkisson
G01 - MEASURING TESTING
Information
Patent Grant
Circuit and method for monitoring defects
Patent number
6,998,866
Issue date
Feb 14, 2006
International Business Machines Corporation
Greg Bazan
G01 - MEASURING TESTING
Information
Patent Grant
Sidewall charge-coupled device with multiple trenches in multiple w...
Patent number
6,515,317
Issue date
Feb 4, 2003
International Business Machines Corp.
Gregory Bazan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of forming thermally stable polycrystal to single crystal el...
Patent number
6,429,101
Issue date
Aug 6, 2002
International Business Machines Corporation
Ricky S. Amos
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
WHOLE WAFER EDGE SEAL
Publication number
20160307848
Publication date
Oct 20, 2016
International Business Machines Corporation
GREGORY BAZAN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF ADDING FABRICATION MONITORS TO INTEGRATED CIRCUIT CHIPS
Publication number
20080017857
Publication date
Jan 24, 2008
James W. Adkisson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF ADDING FABRICATION MONITORS TO INTEGRATED CIRCUIT CHIPS
Publication number
20070160920
Publication date
Jul 12, 2007
James W. Adkisson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF ADDING FABRICATION MONITORS TO INTEGRATED CIRCUIT CHIPS
Publication number
20060225023
Publication date
Oct 5, 2006
International Business Machines Corporation
James W. Adkisson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DEFECT DIAGNOSIS FOR SEMICONDUCTOR INTEGRATED CIRCUITS
Publication number
20060036975
Publication date
Feb 16, 2006
International Business Machines Corporation
James W. Adkisson
G01 - MEASURING TESTING
Information
Patent Application
Designing Scan Chains With Specific Parameter Sensitivities to Iden...
Publication number
20060026472
Publication date
Feb 2, 2006
International Business Machines Corporation
James W. Adkisson
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CIRCUIT AND METHOD FOR MONITORING DEFECTS
Publication number
20060022693
Publication date
Feb 2, 2006
International Business Machines Corporation
Greg Bazan
G01 - MEASURING TESTING
Information
Patent Application
Thermally stable polycrystal to single crystal electrical contact s...
Publication number
20020137300
Publication date
Sep 26, 2002
International Business Machines Corporation
Ricky S. Amos
H01 - BASIC ELECTRIC ELEMENTS