Gregory G. Boll

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Naples, FL, US

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Patents Grantslast 30 patents

Information Patent Grant
Electronic probe apparatus
- Patent number 7,388,389
- Issue date Jun 17, 2008
- GGB Industries Ind., Inc.
- Gregory G. Boll
- G01 - MEASURING TESTING
Information Patent Grant
Probe card for high speed testing
- Patent number 7,049,835
- Issue date May 23, 2006
- Gregory G. Boll
- G01 - MEASURING TESTING
Information Patent Grant
Probe card for high speed testing
- Patent number 6,603,322
- Issue date Aug 5, 2003
- G. G. B. Industries, Inc.
- Harry J. Boll
- G01 - MEASURING TESTING
Information Patent Grant
Broadband impedance matching probe
- Patent number 6,229,327
- Issue date May 8, 2001
- Gregory G. Boll
- G01 - MEASURING TESTING
Information Patent Grant
Probe tip structure
- Patent number 6,118,287
- Issue date Sep 12, 2000
- Gregory George Boll
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit probing apparatus including a capacitor bypass s...
- Patent number 5,373,231
- Issue date Dec 13, 1994
- G. G. B. Industries, Inc.
- Gregory G. Boll
- G01 - MEASURING TESTING
Information Patent Grant
Micropositioner
- Patent number 4,971,159
- Issue date Nov 20, 1990
- G. G. B. Industries, Inc.
- Gregory G. Boll
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Integrated circuit probing apparatus
- Patent number 4,871,964
- Issue date Oct 3, 1989
- G. G. B. Industries, Inc.
- Gregory G. Boll
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Probe card for high speed testing
- Publication number 20060158206
- Publication date Jul 20, 2006
- Gregory G. Boll
- G01 - MEASURING TESTING
Information Patent Application
Probe card for high speed testing
- Publication number 20030132769
- Publication date Jul 17, 2003
- Gregory G. Boll
- G01 - MEASURING TESTING