Gregory L. Cowan

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Boise, ID, US

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor integrated circuit having compression circuitry for c...
- Patent number 6,665,827
- Issue date Dec 16, 2003
- Micron Technology, Inc.
- Roland Ochoa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit having compression circuitry for c...
- Patent number 6,546,512
- Issue date Apr 8, 2003
- Micron Technology, Inc.
- Roland Ochoa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit having compression circuitry for c...
- Patent number 6,314,538
- Issue date Nov 6, 2001
- Micron Technology, Inc.
- Roland Ochoa
- G01 - MEASURING TESTING
Information Patent Grant
Output data compression scheme for use in testing IC memories
- Patent number 6,016,561
- Issue date Jan 18, 2000
- Micron Technology, Inc.
- Fariborz F. Roohparvar
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit having compression circuitry for c...
- Patent number 5,864,565
- Issue date Jan 26, 1999
- Micron Technology, Inc.
- Roland Ochoa
- G01 - MEASURING TESTING
Information Patent Grant
Output data compression scheme for use in testing IC memories
- Patent number 5,787,097
- Issue date Jul 28, 1998
- Micron Technology, Inc.
- Fariborz F. Roohparvar
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor integrated circuit having compression circuitry for c...
- Publication number 20030110428
- Publication date Jun 12, 2003
- Roland Ochoa
- G01 - MEASURING TESTING