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Gregory Pucci
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Batavia, IL, US
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Patents Grants
last 30 patents
Information
Patent Grant
Temperature-gradient cancelation technique and device
Patent number
7,862,229
Issue date
Jan 4, 2011
Memsic, Inc.
Alexander Dribinsky
G01 - MEASURING TESTING
Information
Patent Grant
Power-on-reset circuit having zero static power consumption
Patent number
7,671,643
Issue date
Mar 2, 2010
Memsic, Inc.
Alexander Dribinsky
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Method and circuitry for thermal accelerometer signal conditioning
Patent number
7,305,881
Issue date
Dec 11, 2007
Memsic, Inc.
Yang Zhao
G01 - MEASURING TESTING
Information
Patent Grant
Thermal convection accelerometer with closed-loop heater control
Patent number
6,795,752
Issue date
Sep 21, 2004
Memsic, Inc.
Yang Zhao
G01 - MEASURING TESTING
Information
Patent Grant
Crystal oscillator having input/output pins selectively used for an...
Patent number
5,724,009
Issue date
Mar 3, 1998
Motorola Inc.
Timothy Collins
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Temperature compensated crystal oscillator with disable
Patent number
5,459,436
Issue date
Oct 17, 1995
Motorola, Inc.
Gregory Pucci
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Fail safe voice system for integrated services for digital network...
Patent number
4,853,949
Issue date
Aug 1, 1989
Rockwell International Corporation
Ian A. Schorr
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Patents Applications
last 30 patents
Information
Patent Application
Temperature-gradient cancelation technique and device
Publication number
20100045362
Publication date
Feb 25, 2010
MEMSIC. INC.
Alexander Dribinsky
G01 - MEASURING TESTING
Information
Patent Application
Power-on-reset circuit having zero static power consumption
Publication number
20090174444
Publication date
Jul 9, 2009
Memsic, Inc.
Alexander Dribinsky
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Method and circuitry for thermal accelerometer signal conditioning
Publication number
20050274180
Publication date
Dec 15, 2005
Memsic, Inc.
Yang Zhao
G01 - MEASURING TESTING