Madison, CT, US
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Patent Grant
CuraGen Corporation
John W. Simpson
G01 - MEASURING TESTING
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Patent Grant
Curagen Corporation
Michael W. Deem
C40 - COMBINATORIAL CHEMISTRY
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Patent Grant
CuraGen Corporation
John W. Simpson
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Patent Grant
CuraGen Corporation
John W. Simpson
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
CuraGen Corporation
Joel S. Bader
B82 - NANO-TECHNOLOGY
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Patent Grant
Curagen Corporation
Gregory T. Went
C40 - COMBINATORIAL CHEMISTRY
Information
Patent Grant
CuraGen Corporation
Thomas P. Jarvie
G01 - MEASURING TESTING
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Patent Grant
CuraGen Corporation
John W. Simpson
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
CuraGen Corporation
John W. Simpson
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
CuraGen Corporation
Joel S. Bader
B82 - NANO-TECHNOLOGY
Information
Patent Application
CuraGen Corporation
John W. Simpson
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
