Grzegorz Mrugalski

Person

Wilsonville, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Decompressors for low power decompression of test patterns
- Patent number 8,301,945
- Issue date Oct 30, 2012
- Mentor Graphics Corporation
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Grant
Low power scan testing techniques and apparatus
- Patent number 8,290,738
- Issue date Oct 16, 2012
- Mentor Graphics Corporation
- Xijiang Lin
- G01 - MEASURING TESTING
Information Patent Grant
Accurately identifying failing scan bits in compression environments
- Patent number 8,086,923
- Issue date Dec 27, 2011
- Mentor Graphics Corporation
- Wu-Tung Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Low power decompression of test cubes
- Patent number 8,046,653
- Issue date Oct 25, 2011
- Mentor Graphics Corporation
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Grant
Decompressors for low power decompression of test patterns
- Patent number 8,015,461
- Issue date Sep 6, 2011
- Mentor Graphics Corporation
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Grant
Fault diagnosis of compressed test responses
- Patent number 7,962,820
- Issue date Jun 14, 2011
- Mentor Graphics Corporation
- Janusz Rajski
- G11 - INFORMATION STORAGE
Information Patent Grant
Low power scan testing techniques and apparatus
- Patent number 7,925,465
- Issue date Apr 12, 2011
- Mentor Graphics Corporation
- Xijiang Lin
- G01 - MEASURING TESTING
Information Patent Grant
Compressing test responses using a compactor
- Patent number 7,890,827
- Issue date Feb 15, 2011
- Mentor Graphics Corporation
- Janusz Rajski
- G11 - INFORMATION STORAGE
Information Patent Grant
Multi-stage test response compactors
- Patent number 7,818,644
- Issue date Oct 19, 2010
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Grant
Low power decompression of test cubes
- Patent number 7,797,603
- Issue date Sep 14, 2010
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Grant
Compressing test responses using a compactor
- Patent number 7,743,302
- Issue date Jun 22, 2010
- Janusz Rajski
- G11 - INFORMATION STORAGE
Information Patent Grant
Decompressors for low power decompression of test patterns
- Patent number 7,647,540
- Issue date Jan 12, 2010
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Grant
Fault diagnosis of compressed test responses
- Patent number 7,509,550
- Issue date Mar 24, 2009
- Janusz Rajski
- G11 - INFORMATION STORAGE
Information Patent Grant
Fault diagnosis of compressed test responses having one or more unk...
- Patent number 7,437,640
- Issue date Oct 14, 2008
- Janusz Rajski
- G11 - INFORMATION STORAGE
Information Patent Grant
Compressing test responses using a compactor
- Patent number 7,370,254
- Issue date May 6, 2008
- Janusz Rajski
- G11 - INFORMATION STORAGE
Information Patent Grant
Adaptive fault diagnosis of compressed test responses
- Patent number 7,302,624
- Issue date Nov 27, 2007
- Janusz Rajski
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Test Generator For Low Power Built-In Self-Test
- Publication number 20120272110
- Publication date Oct 25, 2012
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Application
DECOMPRESSORS FOR LOW POWER DECOMPRESSION OF TEST PATTERNS
- Publication number 20110320999
- Publication date Dec 29, 2011
- Mentor Graphics Corporation
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Application
LOW POWER COMPRESSION OF INCOMPATIBLE TEST CUBES
- Publication number 20110231721
- Publication date Sep 22, 2011
- DARIUSZ CZYSZ
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LOW POWER SCAN TESTING TECHNIQUES AND APPARATUS
- Publication number 20110166818
- Publication date Jul 7, 2011
- Mentor Graphics Corporation
- Xijiang Lin
- G01 - MEASURING TESTING
Information Patent Application
Low Power Decompression Of Test Cubes
- Publication number 20100306609
- Publication date Dec 2, 2010
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Application
COMPRESSING TEST RESPONSES USING A COMPACTOR
- Publication number 20100257417
- Publication date Oct 7, 2010
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Application
DECOMPRESSORS FOR LOW POWER DECOMPRESSION OF TEST PATTERNS
- Publication number 20100138708
- Publication date Jun 3, 2010
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Application
Accurately Identifying Failing Scan Bits In Compression Environments
- Publication number 20090254786
- Publication date Oct 8, 2009
- Wu-Tung Cheng
- G01 - MEASURING TESTING
Information Patent Application
FAULT DIAGNOSIS OF COMPRESSED TEST RESPONSES
- Publication number 20090249147
- Publication date Oct 1, 2009
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Application
Low power scan testing techniques and apparatus
- Publication number 20080195346
- Publication date Aug 14, 2008
- Xijiang Lin
- G01 - MEASURING TESTING
Information Patent Application
Compressing test responses using a compactor
- Publication number 20080133987
- Publication date Jun 5, 2008
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Application
Low power decompression of test cubes
- Publication number 20080052586
- Publication date Feb 28, 2008
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Application
Decompressors for low power decompression of test patterns
- Publication number 20080052578
- Publication date Feb 28, 2008
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Application
Multi-stage test response compactors
- Publication number 20070234157
- Publication date Oct 4, 2007
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Application
Generating masking control circuits for test response compactors
- Publication number 20070234169
- Publication date Oct 4, 2007
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Application
Fault diagnosis of compressed test responses
- Publication number 20060041812
- Publication date Feb 23, 2006
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Application
Adaptive fault diagnosis of compressed test responses
- Publication number 20060041813
- Publication date Feb 23, 2006
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Application
Fault diagnosis of compressed test responses having one or more unk...
- Publication number 20060041814
- Publication date Feb 23, 2006
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Application
Compressing test responses using a compactor
- Publication number 20040230884
- Publication date Nov 18, 2004
- Janusz Rajski
- G01 - MEASURING TESTING

Grzegorz Mrugalski

Person

Patents Grantslast 30 patents

Decompressors for low power decompression of test patterns

Low power scan testing techniques and apparatus

Accurately identifying failing scan bits in compression environments

Low power decompression of test cubes

Decompressors for low power decompression of test patterns

Fault diagnosis of compressed test responses

Low power scan testing techniques and apparatus

Compressing test responses using a compactor

Multi-stage test response compactors

Low power decompression of test cubes

Compressing test responses using a compactor

Decompressors for low power decompression of test patterns

Fault diagnosis of compressed test responses

Fault diagnosis of compressed test responses having one or more unk...

Compressing test responses using a compactor

Adaptive fault diagnosis of compressed test responses

Patents Applicationslast 30 patents

Test Generator For Low Power Built-In Self-Test

DECOMPRESSORS FOR LOW POWER DECOMPRESSION OF TEST PATTERNS

LOW POWER COMPRESSION OF INCOMPATIBLE TEST CUBES

LOW POWER SCAN TESTING TECHNIQUES AND APPARATUS

Low Power Decompression Of Test Cubes

COMPRESSING TEST RESPONSES USING A COMPACTOR

DECOMPRESSORS FOR LOW POWER DECOMPRESSION OF TEST PATTERNS

Accurately Identifying Failing Scan Bits In Compression Environments

FAULT DIAGNOSIS OF COMPRESSED TEST RESPONSES

Low power scan testing techniques and apparatus

Compressing test responses using a compactor

Low power decompression of test cubes

Decompressors for low power decompression of test patterns

Multi-stage test response compactors

Generating masking control circuits for test response compactors

Fault diagnosis of compressed test responses

Adaptive fault diagnosis of compressed test responses

Fault diagnosis of compressed test responses having one or more unk...

Compressing test responses using a compactor