Guan-Jhih Liou

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Hsinchu County, TW

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Patents Grantslast 30 patents

Information Patent Grant
Wafer inspection method and wafer probing system
- Patent number 11,353,501
- Issue date Jun 7, 2022
- MPI CORPORATION
- Lin-Lin Chih
- G01 - MEASURING TESTING
Information Patent Grant
Control method of touch display apparatus
- Patent number 11,144,198
- Issue date Oct 12, 2021
- MPI CORPORATION
- Chien-Hung Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Display method of display apparatus
- Patent number 11,036,390
- Issue date Jun 15, 2021
- MPI CORPORATION
- Chien-Hung Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Display screen or portion thereof with graphical user interface
- Patent number D922396
- Issue date Jun 15, 2021
- MPI Corporation
- Lin-Lin Chih
- D14 - Recording, communication, or information retrieval equipment
Information Patent Grant
Wafer inspection method and wafer probing system
- Patent number 10,976,363
- Issue date Apr 13, 2021
- MPI CORPORATION
- Lin-Lin Chih
- G01 - MEASURING TESTING
Information Patent Grant
Aligning method for use in semiconductor inspection apparatus
- Patent number 10,678,370
- Issue date Jun 9, 2020
- MPI CORPORATION
- Lin-Lin Chih
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
WAFER INSPECTION METHOD AND WAFER PROBING SYSTEM
- Publication number 20210055344
- Publication date Feb 25, 2021
- MPI Corporation
- Lin-Lin Chih
- G01 - MEASURING TESTING
Information Patent Application
DISPLAY METHOD OF DISPLAY APPARATUS
- Publication number 20190361074
- Publication date Nov 28, 2019
- MPI Corporation
- Chien-Hung Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTROL METHOD OF TOUCH DISPLAY APPARATUS
- Publication number 20190361603
- Publication date Nov 28, 2019
- MPI Corporation
- Chien-Hung Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER INSPECTION METHOD AND WAFER PROBING SYSTEM
- Publication number 20190187206
- Publication date Jun 20, 2019
- MPI Corporation
- Lin-Lin Chih
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
ALIGNING METHOD FOR USE IN SEMICONDUCTOR INSPECTION APPARATUS
- Publication number 20190171328
- Publication date Jun 6, 2019
- MPI Corporation
- Lin-Lin Chih
- G06 - COMPUTING CALCULATING COUNTING