Guang Li

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Nanjing, CN

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Patents Grantslast 30 patents

Information Patent Grant
Detection scheme for x-ray small angle scattering
- Patent number 11,592,406
- Issue date Feb 28, 2023
- Rensselaer Polytechnic Institute
- Ge Wang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DETECTION SCHEME FOR X-RAY SMALL ANGLE SCATTERING
- Publication number 20220221413
- Publication date Jul 14, 2022
- Rensselaer Polytechnic Institute
- Ge Wang
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING