Guang Yang

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Xiamen, CN

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor testkey pattern and test method thereof
- Patent number 11,721,599
- Issue date Aug 8, 2023
- United Semiconductor (Xiamen) Co., Ltd.
- Linshan Yuan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Radiofrequency device
- Patent number 11,380,627
- Issue date Jul 5, 2022
- United Semiconductor (Xiamen) Co., Ltd.
- Hui Feng Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device
- Patent number 10,985,168
- Issue date Apr 20, 2021
- United Semiconductor (Xiamen) Co., Ltd.
- Jung-Chun Yen
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
TESTKEY STRUCTURE AND MONITORING METHOD WITH TESTKEY STRUCTURE
- Publication number 20230402329
- Publication date Dec 14, 2023
- United Semiconductor (Xiamen) Co., Ltd.
- Hang Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MAKING SEMICONDUCTOR DEVICE
- Publication number 20230352347
- Publication date Nov 2, 2023
- United Semiconductor (Xiamen) Co., Ltd.
- LINSHAN YUAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor testkey and test method thereof
- Publication number 20230260857
- Publication date Aug 17, 2023
- United Semiconductor (Xiamen) Co., Ltd.
- LINSHAN YUAN
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor testkey pattern and test method thereof
- Publication number 20220285235
- Publication date Sep 8, 2022
- United Semiconductor (Xiamen) Co., Ltd.
- LINSHAN YUAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE
- Publication number 20210066322
- Publication date Mar 4, 2021
- United Semiconductor (Xiamen) Co., Ltd.
- Jung-Chun Yen
- H01 - BASIC ELECTRIC ELEMENTS