Guangdian Chen

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Wuhan City, CN

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Patents Grantslast 30 patents

Information Patent Grant
Inspection system of semiconductor device and related inspection me...
- Patent number 11,333,614
- Issue date May 17, 2022
- Yangtze Memory Technologies Co., Ltd.
- Guangdian Chen
- G01 - MEASURING TESTING
Information Patent Grant
Method for calibrating verticality of particle beam and system appl...
- Patent number 11,112,482
- Issue date Sep 7, 2021
- Yangtze Memory Technologies Co., Ltd.
- Guangdian Chen
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND DEVICE FOR DETERMINING COORDINATES OF CONTACT THROUGH-HO...
- Publication number 20240177292
- Publication date May 30, 2024
- Yangtze Memory Technologies Co., Ltd.
- Wenqi WANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION SYSTEM OF SEMICONDUCTOR DEVICE AND RELATED INSPECTION ME...
- Publication number 20210172879
- Publication date Jun 10, 2021
- Yangtze Memory Technologies Co., Ltd.
- Guangdian Chen
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CALIBRATING VERTICALITY OF PARTICLE BEAM AND SYSTEM APPL...
- Publication number 20210132174
- Publication date May 6, 2021
- Yangtze Memory Technologies Co., Ltd.
- Guangdian Chen
- H01 - BASIC ELECTRIC ELEMENTS