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Patents Grants
last 30 patents
Information
Patent Grant
Infrared detector with multi-layer structure based on CMOS process
Patent number
12,107,111
Issue date
Oct 1, 2024
Beijing North Gaoye Technology Co., Ltd.
Guangjie Zhai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multi-spectral imaging method for ultraweak photon emission and sys...
Patent number
9,807,317
Issue date
Oct 31, 2017
Center for Space Science And Applied Research, Chinese Academy of Sciences
Guangjie Zhai
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Time-resolved single-photon or ultra-weak light multi-dimensional i...
Patent number
9,448,162
Issue date
Sep 20, 2016
Center for Space Science And Applied Research, Chinese Academy of Sciences
Guangjie Zhai
G01 - MEASURING TESTING
Information
Patent Grant
Single photon-counting imaging system and method thereof
Patent number
8,723,130
Issue date
May 13, 2014
Center for Space Science And Applied Research, Chinese Academy of Sciences
Guangjie Zhai
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
INFRARED DETECTOR BASED ON CMOS PROCESS
Publication number
20250020516
Publication date
Jan 16, 2025
Beijing North Gaoye Technology Co., Ltd.
Guangjie ZHAI
G01 - MEASURING TESTING
Information
Patent Application
INFRARED DETECTOR WITH MULTI-LAYER STRUCTURE BASED ON CMOS PROCESS
Publication number
20240395848
Publication date
Nov 28, 2024
Beijing North Gaoye Technology Co., Ltd.
Guangjie Zhai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
AN INFRARED DETECTOR WITH MULTI-LAYER STRUCTURE BASED ON CMOS PROCESS
Publication number
20240243160
Publication date
Jul 18, 2024
Beijing North Gaoye Technology Co., Ltd.
Guangjie Zhai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Time-Resolved Single-Photon or Ultra-Weak Light Multi-Dimensional I...
Publication number
20140253713
Publication date
Sep 11, 2014
Guangjie Zhai
G02 - OPTICS
Information
Patent Application
Multi-Spectral Imaging Method for Ultraweak Photon Emission and Sys...
Publication number
20140043486
Publication date
Feb 13, 2014
Guangjie Zhai
G01 - MEASURING TESTING
Information
Patent Application
Single Photon-Counting Imaging System and Method Thereof
Publication number
20130341487
Publication date
Dec 26, 2013
Guangjie Zhai
G01 - MEASURING TESTING