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Guanxing Li
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Beijing, CN
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Patents Grants
last 30 patents
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Patent Grant
Electrode structure for ion drift tube and ion drift tube including...
Patent number
9,147,564
Issue date
Sep 29, 2015
Nuctech Company Limited
Wen He
G01 - MEASURING TESTING
Information
Patent Grant
Sampling method and sampling device
Patent number
8,646,340
Issue date
Feb 11, 2014
Nuctech Company Limited
Yangtian Zhang
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
ELECTRODE STRUCTURE FOR ION DRIFT TUBE AND ION DRIFT TUBE INCLUDING...
Publication number
20140353494
Publication date
Dec 4, 2014
Wen He
G01 - MEASURING TESTING
Information
Patent Application
SAMPLING METHOD AND SAMPLING DEVICE
Publication number
20110126643
Publication date
Jun 2, 2011
Yangtian Zhang
G01 - MEASURING TESTING