Guenter Hoffmann

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Jena, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method for focusing of disk-shaped objects with patterned surfaces...
- Patent number 6,696,679
- Issue date Feb 24, 2004
- Leica Microsystems Wetzlar GmbH
- Michael Graef
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement arrangement and method for inclination measurement
- Patent number 6,504,608
- Issue date Jan 7, 2003
- Leica Microsystems Jena GmbH
- Klaus Hallmeyer
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Optical measurement arrangement and method for inclination measurement
- Publication number 20010006419
- Publication date Jul 5, 2001
- Klaus Hallmeyer
- G01 - MEASURING TESTING