Guenter Holl

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Landskron, AT

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Patents Grantslast 30 patents

Information Patent Grant
Method for detecting damage to a semiconductor chip
- Patent number 9,378,317
- Issue date Jun 28, 2016
- Infineon Technologies AG
- Andreas Tschmelitsch
- G01 - MEASURING TESTING
Information Patent Grant
Detection circuit and method for detecting damage to a semiconducto...
- Patent number 8,575,723
- Issue date Nov 5, 2013
- Infineon Technologies AG
- Andreas Tschmelitsch
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor Device with Damage Detection Circuit and Method for P...
- Publication number 20140040853
- Publication date Feb 6, 2014
- INFINEON TECHNOLOGIES AG
- Andreas Tschmelitsch
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor Device With Damage Detection Circuit and Method for P...
- Publication number 20080035923
- Publication date Feb 14, 2008
- INFINEON TECHNOLOGIES AG
- Andreas Tschmelitsch
- G06 - COMPUTING CALCULATING COUNTING