TREA

Guenter Makosch

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  • Sindelfingen, DE
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Patents Grantslast 30 patents

  • Information Patent Grant

    Interferometric phase measurement
    • Patent number 5,392,116
    • Issue date Feb 21, 1995
    • International Business Machines Corporation
    • Guenter Makosch
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Interferometric mask-wafer alignment
    • Patent number 4,779,001
    • Issue date Oct 18, 1988
    • International Business Machines Corporation
    • Guenter Makosch
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Grant

    Method and device for testing optical imaging systems
    • Patent number 4,429,992
    • Issue date Feb 7, 1984
    • International Business Machines Corporation
    • Gerd Haeusler
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Interferometric measuring system
    • Patent number 4,188,124
    • Issue date Feb 12, 1980
    • International Business Machines Corporation
    • Walter Jaerisch
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Interferometric apparatus and process
    • Patent number 4,167,337
    • Issue date Sep 11, 1979
    • International Business Machines Corporation
    • Walter Jaerisch
    • G01 - MEASURING TESTING