Guenter Schmidt

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Leun, DE

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Patents Grantslast 30 patents

Information Patent Grant
Wafer inspection device
- Patent number 7,424,393
- Issue date Sep 9, 2008
- Vistec Semiconductor Systems GmbH
- Michael Halama
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for scanning a specimen using an optical imagi...
- Patent number 7,247,825
- Issue date Jul 24, 2007
- Vistec Semiconductor Systems GmbH
- Dirk Sönksen
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
Wafer inspection device
- Publication number 20070040241
- Publication date Feb 22, 2007
- Michael Halama
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for scanning a specimen using an optical imagi...
- Publication number 20040129859
- Publication date Jul 8, 2004
- Leica Microsystems Semiconductor GmbH
- Dirk Sonksen
- G02 - OPTICS