Guenther O. Langner

Person

Poughkeepsie, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Curvilinear variable axis lens correction with shifted dipoles
- Patent number 5,793,048
- Issue date Aug 11, 1998
- International Business Machines Corporation
- Paul F. Petric
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Curvilinear variable axis lens correction with centered dipoles
- Patent number 5,757,010
- Issue date May 26, 1998
- International Business Machines Corporation
- Guenther O. Langner
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Curvilinear variable axis lens correction with crossed coils
- Patent number 5,708,274
- Issue date Jan 13, 1998
- International Business Machines Corporation
- Guenther O. Langner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Variable axis stigmator
- Patent number 5,481,164
- Issue date Jan 2, 1996
- International Business Machines Corporation
- Guenther O. Langner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Variable axis stigmator
- Patent number 5,389,858
- Issue date Feb 14, 1995
- International Business Machines Corporation
- Guenther O. Langner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Registration of patterns formed of multiple fields
- Patent number 5,301,124
- Issue date Apr 5, 1994
- International Business Machines Corporation
- Ken T. Chan
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Dynamic compensation of non-linear electron beam landing angle in v...
- Patent number 5,285,074
- Issue date Feb 8, 1994
- International Business Machines Corporation
- Don F. Haire
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam lens and deflection system for plural-level telecentr...
- Patent number 5,136,167
- Issue date Aug 4, 1992
- International Business Machines Corporation
- Guenther O. Langner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automatic focus and deflection correction in E-beam system using op...
- Patent number 4,468,565
- Issue date Aug 28, 1984
- International Business Machines Corporation
- William W. Blair
- B82 - NANO-TECHNOLOGY
Information Patent Grant
System for contactless testing of multi-layer ceramics
- Patent number 4,415,851
- Issue date Nov 15, 1983
- International Business Machines Corporation
- Guenther O. Langner
- G01 - MEASURING TESTING
Information Patent Grant
Variable axis electron beam projection system
- Patent number 4,376,249
- Issue date Mar 8, 1983
- International Business Machines Corporation
- Hans C. Pfeiffer
- H01 - BASIC ELECTRIC ELEMENTS

Guenther O. Langner

Person

Patents Grantslast 30 patents

Curvilinear variable axis lens correction with shifted dipoles

Curvilinear variable axis lens correction with centered dipoles

Curvilinear variable axis lens correction with crossed coils

Variable axis stigmator

Variable axis stigmator

Registration of patterns formed of multiple fields

Dynamic compensation of non-linear electron beam landing angle in v...

Electron beam lens and deflection system for plural-level telecentr...

Automatic focus and deflection correction in E-beam system using op...

System for contactless testing of multi-layer ceramics

Variable axis electron beam projection system