Guido De Boer

Person

Leerdam, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Lithography system, method of clamping and wafer table
- Patent number RE49488
- Issue date Apr 11, 2023
- ASML Netherlands B.V.
- Guido De Boer
Information Patent Grant
Enclosure for a target processing machine
- Patent number 10,144,134
- Issue date Dec 4, 2018
- Mapper Lithography IP B.V.
- Joep Gerard Vijverberg
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Interferometer module
- Patent number 9,690,215
- Issue date Jun 27, 2017
- Mapper Lithography IP B.V.
- Guido de Boer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Lithography system with differential interferometer module
- Patent number 9,678,443
- Issue date Jun 13, 2017
- Mapper Lithography IP B.V.
- Guido de Boer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Lithography system, method of clamping and wafer table
- Patent number 9,665,013
- Issue date May 30, 2017
- Mapper Lithography IP B.V.
- Guido De Boer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Lithography system, method of clamping and wafer table
- Patent number 9,645,511
- Issue date May 9, 2017
- Mapper Lithography IP B.V.
- Guido De Boer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus for transferring a substrate in a lithography system
- Patent number 9,575,418
- Issue date Feb 21, 2017
- Mapper Lithography IP B.V.
- Vincent Sylvester Kuiper
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Network architecture and protocol for cluster of lithography machines
- Patent number 9,507,629
- Issue date Nov 29, 2016
- Mapper Lithography IP B.V.
- Marcel Nicolaas Jacobus Van Kervinck
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for forming an optical fiber array
- Patent number 9,457,549
- Issue date Oct 4, 2016
- Mapper Lithography IP B.V.
- Guido De Boer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Lithography system for processing a target, such as a wafer, and a...
- Patent number 9,395,636
- Issue date Jul 19, 2016
- Mapper Lithography IP B.V.
- Guido De Boer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Position determination in a lithography system using a substrate ha...
- Patent number 9,395,635
- Issue date Jul 19, 2016
- Mapper Lithography IP B.V.
- Guido De Boer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Lithography system for processing at least a part of a target
- Patent number 9,383,662
- Issue date Jul 5, 2016
- Mapper Lithography IP B.V.
- Niels Vergeer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Electro-optical element for multiple beam alignment
- Patent number 9,362,084
- Issue date Jun 7, 2016
- Mapper Lithography IP B.V.
- Alrik van den Brom
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Alignment of an interferometer module for use in an exposure tool
- Patent number 9,261,800
- Issue date Feb 16, 2016
- Mapper Lithography IP B.V.
- Guido de Boer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Lithography system for processing a target, such as a wafer, a meth...
- Patent number 9,201,315
- Issue date Dec 1, 2015
- Mapper Lithography IP B.V.
- Guido De Boer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus for transferring a substrate in a lithography system
- Patent number 9,176,397
- Issue date Nov 3, 2015
- Mapper Lithography IP B.V.
- Vincent Sylvester Kuiper
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Network architecture and protocol for cluster of lithography machines
- Patent number 9,086,912
- Issue date Jul 21, 2015
- Mapper Lithography IP B.V.
- Marcel Nicolaas Jacobus Van Kervinck
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Charged particle beam lithography system and target positioning device
- Patent number 9,082,584
- Issue date Jul 14, 2015
- Mapper Lithography IP B.V.
- Jerry Peijster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interferometer module
- Patent number 9,069,265
- Issue date Jun 30, 2015
- Mapper Lithography IP B.V.
- Guido de Boer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Arrangement of optical fibers, and a method of forming such arrange...
- Patent number 9,036,962
- Issue date May 19, 2015
- Mapper Lithography IP B.V.
- Guido De Boer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Lithography system and method for storing positional data of a target
- Patent number 9,009,631
- Issue date Apr 14, 2015
- Mapper Lighography IP B.V.
- Alexius Otto Looije
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Charged particle beam lithography system and target positioning device
- Patent number 8,957,395
- Issue date Feb 17, 2015
- Mapper Lithography IP B.V.
- Jerry Peijster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of processing a substrate in a lithography system
- Patent number 8,936,994
- Issue date Jan 20, 2015
- Mapper Lithography IP B.V.
- Vincent Sylvester Kuiper
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Vibration isolation module and substrate processing system
- Patent number 8,905,369
- Issue date Dec 9, 2014
- Mapper Lithography IP B.V.
- Jerry Johannes Martinus Peijster
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Lithography system and method of processing substrates in such a li...
- Patent number 8,895,943
- Issue date Nov 25, 2014
- Mapper Lithography IP B.V.
- Guido De Boer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Capacitive sensing system
- Patent number 8,841,920
- Issue date Sep 23, 2014
- Mapper Lithography IP B.V.
- Guido De Boer
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam lithography system and target positioning device
- Patent number 8,796,644
- Issue date Aug 5, 2014
- Mapper Lithography IP B.V.
- Jerry Peijster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam lithography system and target positioning device
- Patent number 8,779,392
- Issue date Jul 15, 2014
- Mapper Lithography IP B.V.
- Jerry Peijster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lithography system, method of clamping and wafer table
- Patent number 8,705,010
- Issue date Apr 22, 2014
- Mapper Lithography IP B.V.
- Guido De Boer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Charged particle lithography apparatus and method of generating vac...
- Patent number 8,690,005
- Issue date Apr 8, 2014
- Mapper Lithography IP B.V.
- Sander Baltussen
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
LITHOGRAPHY SYSTEM WITH DIFFERENTIAL INTERFEROMETER MODULE
- Publication number 20170277043
- Publication date Sep 28, 2017
- MAPPER LITHOGRAPHY IP BV
- Guido de Boer
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for transferring a substrate in a lithography system
- Publication number 20160004173
- Publication date Jan 7, 2016
- MAPPER LITHOGRAPHY IP BV
- Vincent Sylvester KUIPER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
ENCLOSURE FOR A TARGET PROCESSING MACHINE
- Publication number 20150321356
- Publication date Nov 12, 2015
- MAPPER LITHOGRAPHY IP BV
- Joep Gerard Vijverberg
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
Network architecture and protocol for cluster of lithography machines
- Publication number 20150309424
- Publication date Oct 29, 2015
- MAPPER LITHOGRAPHY IP BV
- Marcel Nicolaas Jacobus VAN KERVINCK
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
INTERFEROMETER MODULE
- Publication number 20150268032
- Publication date Sep 24, 2015
- MAPPER LITHOGRAPHY IP BV
- Guido de Boer
- G01 - MEASURING TESTING
Information Patent Application
Method for forming an optical fiber array
- Publication number 20150190994
- Publication date Jul 9, 2015
- MAPPER LITHOGRAPHY IP BV
- Guido DE BOER
- B32 - LAYERED PRODUCTS
Information Patent Application
Method of determining a position of a substrate in a lithography sy...
- Publication number 20150177625
- Publication date Jun 25, 2015
- MAPPER LITHOGRAPHY IP BV
- Guido DE BOER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
CHARGED PARTICLE BEAM LITHOGRAPHY SYSTEM AND TARGET POSITIONING DEVICE
- Publication number 20150162165
- Publication date Jun 11, 2015
- MAPPER LITHOGRAPHY IP BV
- Jerry PEIJSTER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Lithography System and Target Positioning Device
- Publication number 20140203187
- Publication date Jul 24, 2014
- Jerry Peijster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VIBRATION ISOLATION MODULE AND SUBSTRATE PROCESSING SYSTEM
- Publication number 20140197330
- Publication date Jul 17, 2014
- MAPPER LITHOGRAPHY IP BV
- Jerry Johannes Martinus Peijster
- B82 - NANO-TECHNOLOGY
Information Patent Application
LITHOGRAPHY SYSTEM, METHOD OF CLAMPING AND WAFER TABLE
- Publication number 20140185028
- Publication date Jul 3, 2014
- Guido DE BOER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
LITHOGRAPHY SYSTEM, METHOD OF CLAMPING AND WAFER TABLE
- Publication number 20140176920
- Publication date Jun 26, 2014
- Guido DE BOER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
CAPACITIVE SENSING SYSTEM
- Publication number 20140049276
- Publication date Feb 20, 2014
- MAPPER LITHOGRAPHY IP BV
- Guido DE BOER
- G01 - MEASURING TESTING
Information Patent Application
Network architecture and protocol for cluster of lithography machines
- Publication number 20130111485
- Publication date May 2, 2013
- MAPPER LITHOGRAPHY IP BV
- Marcel Nicolaas Jacobus VAN KERVINCK
- B82 - NANO-TECHNOLOGY
Information Patent Application
Apparatus for transferring a substrate in a lithography system
- Publication number 20130044305
- Publication date Feb 21, 2013
- MAPPER LITHOGRAPHY IP BV
- Vincent Sylvester KUIPER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Arrangement of optical fibers, and a method of forming such arrange...
- Publication number 20130043413
- Publication date Feb 21, 2013
- MAPPER LITHOGRAPHY IP BV
- Guido DE BOER
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method of processing a substrate in a lithography system
- Publication number 20130034421
- Publication date Feb 7, 2013
- MAPPER LITHOGRAPHY IP BV
- Vincent Sylvester KUIPER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LITHOGRAPHY SYSTEM FOR PROCESSING A TARGET, SUCH AS A WAFER, A METH...
- Publication number 20120268724
- Publication date Oct 25, 2012
- Guido De Boer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
LITHOGRAPHY SYSTEM FOR PROCESSING A TARGET, SUCH AS A WAFER, AND A...
- Publication number 20120268725
- Publication date Oct 25, 2012
- Guido De Boer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
POSITION DETERMINATION IN A LITHOGRAPHY SYSTEM USING A SUBSTRATE HA...
- Publication number 20120267802
- Publication date Oct 25, 2012
- Guido De Boer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
LITHOGRAPHY SYSTEM WITH DIFFERENTIAL INTERFEROMETER MODULE
- Publication number 20120249984
- Publication date Oct 4, 2012
- Guido de Boer
- G01 - MEASURING TESTING
Information Patent Application
ALIGNMENT OF AN INTERFEROMETER MODULE FOR USE IN AN EXPOSURE TOOL
- Publication number 20120250030
- Publication date Oct 4, 2012
- Guido de Boer
- G01 - MEASURING TESTING
Information Patent Application
LITHOGRAPHY SYSTEM AND METHOD OF PROCESSING SUBSTRATES IN SUCH A LI...
- Publication number 20120175527
- Publication date Jul 12, 2012
- MAPPER LITHOGRAPHY IP BV
- Guido DE BOER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
CHARGED PARTICLE BEAM LITHOGRAPHY SYSTEM AND TARGET POSITIONING DEVICE
- Publication number 20120056100
- Publication date Mar 8, 2012
- Jerry Peijster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EXPOSURE METHOD
- Publication number 20110261344
- Publication date Oct 27, 2011
- MAPPER LITHOGRAPHY IP BV
- Guido DE BOER
- G01 - MEASURING TESTING
Information Patent Application
CAPACITIVE SENSING SYSTEM WITH DIFFERENTIAL PAIRS
- Publication number 20110254565
- Publication date Oct 20, 2011
- MAPPER LITHOGRAPHY IP BV
- Guido De Boer
- G01 - MEASURING TESTING
Information Patent Application
CAPACITIVE SENSING SYSTEM
- Publication number 20110193574
- Publication date Aug 11, 2011
- MAPPER LITHOGRAPHY IP BV
- Guido DE BOER
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED SENSOR SYSTEM
- Publication number 20110193573
- Publication date Aug 11, 2011
- MAPPER LITHOGRAPHY IP BV
- Guido DE BOER
- G01 - MEASURING TESTING
Information Patent Application
Lithography Machine and Substrate Handling Arrangement
- Publication number 20110049393
- Publication date Mar 3, 2011
- MAPPER LITHOGRAPHY IP BV
- Guido DE BOER
- B82 - NANO-TECHNOLOGY
Information Patent Application
CHARGED PARTICLE LITHOGRAPHY APPARATUS AND METHOD OF GENERATING VAC...
- Publication number 20110042579
- Publication date Feb 24, 2011
- MAPPER LITHOGRAPHY IP BV
- Guido DE BOER
- B82 - NANO-TECHNOLOGY

Guido De Boer

Person

Patents Grantslast 30 patents

Lithography system, method of clamping and wafer table

Enclosure for a target processing machine

Interferometer module

Lithography system with differential interferometer module

Lithography system, method of clamping and wafer table

Lithography system, method of clamping and wafer table

Apparatus for transferring a substrate in a lithography system

Network architecture and protocol for cluster of lithography machines

Method for forming an optical fiber array

Lithography system for processing a target, such as a wafer, and a...

Position determination in a lithography system using a substrate ha...

Lithography system for processing at least a part of a target

Electro-optical element for multiple beam alignment

Alignment of an interferometer module for use in an exposure tool

Lithography system for processing a target, such as a wafer, a meth...

Apparatus for transferring a substrate in a lithography system

Network architecture and protocol for cluster of lithography machines

Charged particle beam lithography system and target positioning device

Interferometer module

Arrangement of optical fibers, and a method of forming such arrange...

Lithography system and method for storing positional data of a target

Charged particle beam lithography system and target positioning device

Method of processing a substrate in a lithography system

Vibration isolation module and substrate processing system

Lithography system and method of processing substrates in such a li...

Capacitive sensing system

Charged particle beam lithography system and target positioning device

Charged particle beam lithography system and target positioning device

Lithography system, method of clamping and wafer table

Charged particle lithography apparatus and method of generating vac...

Patents Applicationslast 30 patents

LITHOGRAPHY SYSTEM WITH DIFFERENTIAL INTERFEROMETER MODULE

Apparatus for transferring a substrate in a lithography system

ENCLOSURE FOR A TARGET PROCESSING MACHINE

Network architecture and protocol for cluster of lithography machines

INTERFEROMETER MODULE

Method for forming an optical fiber array

Method of determining a position of a substrate in a lithography sy...

CHARGED PARTICLE BEAM LITHOGRAPHY SYSTEM AND TARGET POSITIONING DEVICE

Charged Particle Beam Lithography System and Target Positioning Device

VIBRATION ISOLATION MODULE AND SUBSTRATE PROCESSING SYSTEM

LITHOGRAPHY SYSTEM, METHOD OF CLAMPING AND WAFER TABLE

LITHOGRAPHY SYSTEM, METHOD OF CLAMPING AND WAFER TABLE

CAPACITIVE SENSING SYSTEM

Network architecture and protocol for cluster of lithography machines

Apparatus for transferring a substrate in a lithography system

Arrangement of optical fibers, and a method of forming such arrange...

Method of processing a substrate in a lithography system

LITHOGRAPHY SYSTEM FOR PROCESSING A TARGET, SUCH AS A WAFER, A METH...

LITHOGRAPHY SYSTEM FOR PROCESSING A TARGET, SUCH AS A WAFER, AND A...

POSITION DETERMINATION IN A LITHOGRAPHY SYSTEM USING A SUBSTRATE HA...

LITHOGRAPHY SYSTEM WITH DIFFERENTIAL INTERFEROMETER MODULE

ALIGNMENT OF AN INTERFEROMETER MODULE FOR USE IN AN EXPOSURE TOOL

LITHOGRAPHY SYSTEM AND METHOD OF PROCESSING SUBSTRATES IN SUCH A LI...

CHARGED PARTICLE BEAM LITHOGRAPHY SYSTEM AND TARGET POSITIONING DEVICE

EXPOSURE METHOD

CAPACITIVE SENSING SYSTEM WITH DIFFERENTIAL PAIRS

CAPACITIVE SENSING SYSTEM

INTEGRATED SENSOR SYSTEM

Lithography Machine and Substrate Handling Arrangement

CHARGED PARTICLE LITHOGRAPHY APPARATUS AND METHOD OF GENERATING VAC...