Guillaume AUDOIT

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BOURGOIN JALLIEU, FR

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Patents Grantslast 30 patents

Information Patent Grant
Creation of stress in the channel of a nanosheet transistor
- Patent number 11,575,003
- Issue date Feb 7, 2023
- International Business Machines Corporation
- Nicolas Loubet
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Creation of stress in the channel of a nanosheet transistor
- Patent number 11,049,933
- Issue date Jun 29, 2021
- International Business Machines Corporation
- Nicolas Loubet
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for characterizing a sample combining an X-ray characterizat...
- Patent number 10,481,109
- Issue date Nov 19, 2019
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Agnieszka Priebe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tomography sample preparation systems and methods with improved spe...
- Patent number 10,190,953
- Issue date Jan 29, 2019
- Guillaume Delpy
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CREATION OF STRESS IN THE CHANNEL OF A NANOSHEET TRANSISTOR
- Publication number 20210257450
- Publication date Aug 19, 2021
- International Business Machines Corporation
- Nicolas Loubet
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CREATION OF STRESS IN THE CHANNEL OF A NANOSHEET TRANSISTOR
- Publication number 20210020743
- Publication date Jan 21, 2021
- International Business Machines Corporation
- Nicolas Loubet
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TOMOGRAPHY SAMPLE PREPARATION SYSTEMS AND METHODS WITH IMPROVED SPE...
- Publication number 20180143110
- Publication date May 24, 2018
- FEI Company
- Guillaume Delpy
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CHARACTERIZING A SAMPLE COMBINING AN X-RAY CHARACTERIZAT...
- Publication number 20170219502
- Publication date Aug 3, 2017
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Agnieszka PRIEBE
- G01 - MEASURING TESTING