Guillermo M. Loubriel

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Albuquerque, NM, US

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Patents Grantslast 30 patents

Information Patent Grant
Defect screening method for electronic circuits and circuit compone...
- Patent number 10,145,894
- Issue date Dec 4, 2018
- National Technology & Engineering Solutions of Sandia, LLC
- Paiboon Tangyunyong
- G01 - MEASURING TESTING
Information Patent Grant
Scanning method for screening of electronic devices
- Patent number 10,094,874
- Issue date Oct 9, 2018
- National Technology & Engineering Solutions of Sandia, LLC
- Paiboon Tangyunyong
- G01 - MEASURING TESTING
Information Patent Grant
Detection of contraband using microwave radiation
- Patent number 6,480,141
- Issue date Nov 12, 2002
- Sandia Corporation
- Richard P. Toth
- G01 - MEASURING TESTING