Gulbagh SINGH

Person

Hsinchu, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor structure and method for manufacturing the same
- Patent number 12,211,934
- Issue date Jan 28, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor structure and method for manufacturing the same
- Patent number 12,199,181
- Issue date Jan 14, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a metal-oxide-semiconductor field-effect tr...
- Patent number 12,191,196
- Issue date Jan 7, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with air-void in spacer
- Patent number 12,027,581
- Issue date Jul 2, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Source/drain epitaxial layer profile
- Patent number 11,942,547
- Issue date Mar 26, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device structure and methods of forming the same
- Patent number 11,935,895
- Issue date Mar 19, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor wafer with devices having different top layer thickne...
- Patent number 11,887,987
- Issue date Jan 30, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MOSFET device structure with air-gaps in spacer and methods for for...
- Patent number 11,855,170
- Issue date Dec 26, 2023
- Taiwan Semiconductor Manufacturing Company Limited
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
SOI device structure for robust isolation
- Patent number 11,855,137
- Issue date Dec 26, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Lin-Chen Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple thickness semiconductor-on-insulator field effect transist...
- Patent number 11,817,345
- Issue date Nov 14, 2023
- Taiwan Semiconductor Manufacturing Company Limited
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor structure including buffer layer
- Patent number 11,810,879
- Issue date Nov 7, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Gulbagh Singh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reducing RC delay in semiconductor devices
- Patent number 11,804,439
- Issue date Oct 31, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory device with improved data retention
- Patent number 11,653,498
- Issue date May 16, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a metal-oxide-semiconductor field-effect tr...
- Patent number 11,476,157
- Issue date Oct 18, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Source/drain epitaxial layer profile
- Patent number 11,462,642
- Issue date Oct 4, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor arrangement with airgap and method of forming
- Patent number 11,417,749
- Issue date Aug 16, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with air-void in spacer
- Patent number 11,404,537
- Issue date Aug 2, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple thickness semiconductor-on-insulator field effect transist...
- Patent number 11,398,403
- Issue date Jul 26, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MOSFET device structure with air-gaps in spacer and methods for for...
- Patent number 11,367,778
- Issue date Jun 21, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor wafer with devices having different top layer thickne...
- Patent number 11,348,944
- Issue date May 31, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reducing RC delay in semiconductor devices
- Patent number 11,335,638
- Issue date May 17, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of designing a layout, method of making a semiconductor stru...
- Patent number 11,309,268
- Issue date Apr 19, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Gulbagh Singh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Isolation regions for reduced junction leakage
- Patent number 11,264,456
- Issue date Mar 1, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
SOI device structure for robust isolation
- Patent number 11,257,902
- Issue date Feb 22, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Lin-Chen Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming a bulk semiconductor substrate configured to exh...
- Patent number 11,211,283
- Issue date Dec 28, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structures and methods for noise isolation in semiconductor devices
- Patent number 11,183,570
- Issue date Nov 23, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Source/drain epitaxial layer profile
- Patent number 10,790,391
- Issue date Sep 29, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with post passivation structure
- Patent number 10,727,191
- Issue date Jul 28, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd
- Gulbagh Singh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Bulk semiconductor substrate configured to exhibit semiconductor-on...
- Patent number 10,672,795
- Issue date Jun 2, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Isolation regions for reduced junction leakage
- Patent number 10,636,870
- Issue date Apr 28, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
REDUCING RC DELAY IN SEMICONDUCTOR DEVICES
- Publication number 20240379563
- Publication date Nov 14, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE WITH AIR-VOID IN SPACER
- Publication number 20240321954
- Publication date Sep 26, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE STRUCTURE AND METHODS OF FORMING THE SAME
- Publication number 20240203998
- Publication date Jun 20, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Gulbagh SINGH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOURCE/DRAIN EPITAXIAL LAYER PROFILE
- Publication number 20240194784
- Publication date Jun 13, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Gulbagh SINGH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR WAFER WITH DEVICES HAVING DIFFERENT TOP LAYER THICKNE...
- Publication number 20240170489
- Publication date May 23, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MOSFET DEVICE STRUCTURE WITH AIR-GAPS IN SPACER AND METHODS FOR FOR...
- Publication number 20240079471
- Publication date Mar 7, 2024
- Taiwan Semiconductor Manufacturing Company Limited
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MAKING SEMICONDUCTOR STRUCTURE INCLUDING BUFFER LAYER
- Publication number 20240063158
- Publication date Feb 22, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Gulbagh SINGH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NOVEL SOI DEVICE STRUCTURE FOR ROBUST ISOLATION
- Publication number 20230387197
- Publication date Nov 30, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Lin-Chen Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REDUCING RC DELAY IN SEMICONDUCTOR DEVICES
- Publication number 20230378071
- Publication date Nov 23, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20230378347
- Publication date Nov 23, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Gulbagh SINGH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METAL-INSULATOR-METAL (MIM) CAPACITOR AND METHOD OF MAKING SAME
- Publication number 20230011605
- Publication date Jan 12, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Gulbagh SINGH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE STRUCTURE AND METHODS OF FORMING THE SAME
- Publication number 20230010934
- Publication date Jan 12, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Gulbagh SINGH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMORY DEVICE WITH IMPROVED DATA RETENTION
- Publication number 20220415916
- Publication date Dec 29, 2022
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20220367242
- Publication date Nov 17, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Gulbagh SINGH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOURCE/DRAIN EPITAXIAL LAYER PROFILE
- Publication number 20220359751
- Publication date Nov 10, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Gulbagh SINGH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR ARRANGEMENT WITH AIRGAP AND METHOD OF FORMING
- Publication number 20220359707
- Publication date Nov 10, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Gulbagh SINGH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE WITH AIR-VOID IN SPACER
- Publication number 20220352307
- Publication date Nov 3, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE THICKNESS SEMICONDUCTOR-ON-INSULATOR FIELD EFFECT TRANSIST...
- Publication number 20220328345
- Publication date Oct 13, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR WAFER WITH DEVICES HAVING DIFFERENT TOP LAYER THICKNE...
- Publication number 20220285403
- Publication date Sep 8, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Reducing RC Delay in Semiconductor Devices
- Publication number 20220278042
- Publication date Sep 1, 2022
- TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MOSFET DEVICE STRUCTURE WITH AIR-GAPS IN SPACER AND METHODS FOR FOR...
- Publication number 20220271141
- Publication date Aug 25, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20220246756
- Publication date Aug 4, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Gulbagh SINGH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20220216095
- Publication date Jul 7, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Gulbagh SINGH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE INCLUDING BUFFER LAYER
- Publication number 20220208704
- Publication date Jun 30, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Gulbagh SINGH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NOVEL SOI DEVICE STRUCTURE FOR ROBUST ISOLATION
- Publication number 20220157935
- Publication date May 19, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Lin-Chen Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NOVEL SOI DEVICE STRUCTURE FOR ROBUST ISOLATION
- Publication number 20210376070
- Publication date Dec 2, 2021
- Taiwan Semiconductor Manufacturing Company Limited
- Lin-Chen Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE THICKNESS SEMICONDUCTOR-ON-INSULATOR FIELD EFFECT TRANSIST...
- Publication number 20210375666
- Publication date Dec 2, 2021
- Taiwan Semiconductor Manufacturing Company Limited
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURES AND METHODS FOR NOISE ISOLATION IN SEMICONDUCTOR DEVICES
- Publication number 20210328031
- Publication date Oct 21, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Gulbagh SINGH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE WITH AIR-VOID IN SPACER
- Publication number 20210328009
- Publication date Oct 21, 2021
- Taiwan Semiconductor Manufacturing Company Limited
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR WAFER WITH DEVICES HAVING DIFFERENT TOP LAYER THICKNE...
- Publication number 20210327902
- Publication date Oct 21, 2021
- Taiwan Semiconductor Manufacturing Company Limited
- Gulbagh Singh
- H01 - BASIC ELECTRIC ELEMENTS

Gulbagh SINGH

Person

Patents Grantslast 30 patents

Semiconductor structure and method for manufacturing the same

Semiconductor structure and method for manufacturing the same

Method of manufacturing a metal-oxide-semiconductor field-effect tr...

Semiconductor device with air-void in spacer

Source/drain epitaxial layer profile

Semiconductor device structure and methods of forming the same

Semiconductor wafer with devices having different top layer thickne...

MOSFET device structure with air-gaps in spacer and methods for for...

SOI device structure for robust isolation

Multiple thickness semiconductor-on-insulator field effect transist...

Semiconductor structure including buffer layer

Reducing RC delay in semiconductor devices

Memory device with improved data retention

Method of manufacturing a metal-oxide-semiconductor field-effect tr...

Source/drain epitaxial layer profile

Semiconductor arrangement with airgap and method of forming

Semiconductor device with air-void in spacer

Multiple thickness semiconductor-on-insulator field effect transist...

MOSFET device structure with air-gaps in spacer and methods for for...

Semiconductor wafer with devices having different top layer thickne...

Reducing RC delay in semiconductor devices

Method of designing a layout, method of making a semiconductor stru...

Isolation regions for reduced junction leakage

SOI device structure for robust isolation

Method for forming a bulk semiconductor substrate configured to exh...

Structures and methods for noise isolation in semiconductor devices

Source/drain epitaxial layer profile

Semiconductor device with post passivation structure

Bulk semiconductor substrate configured to exhibit semiconductor-on...

Isolation regions for reduced junction leakage

Patents Applicationslast 30 patents

REDUCING RC DELAY IN SEMICONDUCTOR DEVICES

SEMICONDUCTOR DEVICE WITH AIR-VOID IN SPACER

SEMICONDUCTOR DEVICE STRUCTURE AND METHODS OF FORMING THE SAME

SOURCE/DRAIN EPITAXIAL LAYER PROFILE

SEMICONDUCTOR WAFER WITH DEVICES HAVING DIFFERENT TOP LAYER THICKNE...

MOSFET DEVICE STRUCTURE WITH AIR-GAPS IN SPACER AND METHODS FOR FOR...

METHOD OF MAKING SEMICONDUCTOR STRUCTURE INCLUDING BUFFER LAYER

NOVEL SOI DEVICE STRUCTURE FOR ROBUST ISOLATION

REDUCING RC DELAY IN SEMICONDUCTOR DEVICES

SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING THE SAME

METAL-INSULATOR-METAL (MIM) CAPACITOR AND METHOD OF MAKING SAME

SEMICONDUCTOR DEVICE STRUCTURE AND METHODS OF FORMING THE SAME

MEMORY DEVICE WITH IMPROVED DATA RETENTION

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME

SOURCE/DRAIN EPITAXIAL LAYER PROFILE

SEMICONDUCTOR ARRANGEMENT WITH AIRGAP AND METHOD OF FORMING

SEMICONDUCTOR DEVICE WITH AIR-VOID IN SPACER

MULTIPLE THICKNESS SEMICONDUCTOR-ON-INSULATOR FIELD EFFECT TRANSIST...

SEMICONDUCTOR WAFER WITH DEVICES HAVING DIFFERENT TOP LAYER THICKNE...

Reducing RC Delay in Semiconductor Devices

MOSFET DEVICE STRUCTURE WITH AIR-GAPS IN SPACER AND METHODS FOR FOR...

SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING THE SAME

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME

SEMICONDUCTOR STRUCTURE INCLUDING BUFFER LAYER

NOVEL SOI DEVICE STRUCTURE FOR ROBUST ISOLATION

NOVEL SOI DEVICE STRUCTURE FOR ROBUST ISOLATION

MULTIPLE THICKNESS SEMICONDUCTOR-ON-INSULATOR FIELD EFFECT TRANSIST...

STRUCTURES AND METHODS FOR NOISE ISOLATION IN SEMICONDUCTOR DEVICES

SEMICONDUCTOR DEVICE WITH AIR-VOID IN SPACER

SEMICONDUCTOR WAFER WITH DEVICES HAVING DIFFERENT TOP LAYER THICKNE...