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Gunther HANNS
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Widnau, CH
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Patents Grants
last 30 patents
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Patent Grant
Method and apparatus for determining positions
Patent number
8,011,112
Issue date
Sep 6, 2011
Leica Geosystems AG
Günther Hanns
G01 - MEASURING TESTING
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Patent Grant
Process and device for the automatic location of reference markers
Patent number
6,734,952
Issue date
May 11, 2004
Leica Geosystems, AG
Paul Benz
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
METHOD AND APPARATUS FOR DETERMINING POSITIONS
Publication number
20080140249
Publication date
Jun 12, 2008
Leica Geosystems AG
Gunther HANNS
G01 - MEASURING TESTING
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Patent Application
Process and device for the automatic location of reference markers
Publication number
20030169414
Publication date
Sep 11, 2003
Paul Benz
G01 - MEASURING TESTING