Gunther Scheunert

Follow

Person

Muenster, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Multiple particle beam microscope and associated method with an imp...
- Patent number 12,283,457
- Issue date Apr 22, 2025
- Carl Zeiss MultiSEM GmbH
- Nicole Rauwolf
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF CHARACTERIZING A FAULT IN A SCANNING ELECTRON MICROSCOPE
- Publication number 20250183000
- Publication date Jun 5, 2025
- Carl Zeiss SMT GMBH
- David Laemmle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE PARTICLE BEAM MICROSCOPE AND ASSOCIATED METHOD WITH AN IMP...
- Publication number 20220246388
- Publication date Aug 4, 2022
- Carl Zeiss MultiSEM GmbH
- Nicole Rauwolf
- H01 - BASIC ELECTRIC ELEMENTS