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Gunther STEINFELD
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Waedenswil, CH
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Patent Application
CHARGED-PARTICLE BEAM DEVICE FOR DIFFRACTION ANALYSIS
Publication number
20240355577
Publication date
Oct 24, 2024
Eldico Scientific AG
Gunther STEINFELD
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
DIFFRACTOMETER FOR CHARGED-PARTICLE CRYSTALLOGRAPHY
Publication number
20220238299
Publication date
Jul 28, 2022
ELDICO SCIENTIFIC AG
Gunther STEINFELD
H01 - BASIC ELECTRIC ELEMENTS