Guo Qiang

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Singapore, SG

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Patents Grantslast 30 patents

Information Patent Grant
Via electromigration improvement by changing the via bottom geometr...
- Patent number 7,781,895
- Issue date Aug 24, 2010
- Chartered Semiconductor Manufacturing Ltd.
- Bei Chao Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Via electromigration improvement by changing the via bottom geometr...
- Patent number 7,691,739
- Issue date Apr 6, 2010
- Chartered Semiconductor Manufacturing Ltd.
- Bei Chao Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Via electromigration improvement by changing the via bottom geometr...
- Patent number 7,045,455
- Issue date May 16, 2006
- Chartered Semiconductor Manufacturing Ltd.
- Beichao Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method to form Cu/OSG dual damascene structure for high performance...
- Patent number 6,913,994
- Issue date Jul 5, 2005
- Agency for Science, Technology and Research
- Qiang Guo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test structures for on-chip real-time reliability testing
- Patent number 6,724,214
- Issue date Apr 20, 2004
- Chartered Semiconductor Manufacturing Ltd.
- Indrajit Manna
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
VIA ELECTROMIGRATION IMPROVEMENT BY CHANGING THE VIA BOTTOM GEOMETR...
- Publication number 20090250818
- Publication date Oct 8, 2009
- Chartered Semiconductor Manufacturing LTD.
- Bei Chao Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Via electromigration improvement by changing the via bottom geometr...
- Publication number 20060160354
- Publication date Jul 20, 2006
- Chartered Semiconductor Manufacturing LTD.
- BeiChao Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method to form Cu/OSG dual damascene structure for high performance...
- Publication number 20040203223
- Publication date Oct 14, 2004
- Institute of Microelectronics
- Qiang Guo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST STRUCTURES FOR ON-CHIP REAL-TIME RELIABILITY TESTING
- Publication number 20040051553
- Publication date Mar 18, 2004
- Chartered Semiconductor Manufacturing Ltd.
- Indrajit Manna
- G01 - MEASURING TESTING