Guohong Zhang

Person

Plano, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Merging sub-resolution assist features of a photolithographic mask
- Patent number 8,291,354
- Issue date Oct 16, 2012
- Texas Instruments Incorporated
- Sean C. O'Brien
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Merging sub-resolution assist features of a photolithographic mask
- Patent number 8,056,029
- Issue date Nov 8, 2011
- Texas Instruments Incorporated
- Sean C. O'Brien
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of mapping lithography focus errors
- Patent number 7,642,021
- Issue date Jan 5, 2010
- Texas Instruments Incorporated
- Guohong Zhang
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Merging sub-resolution assist features of a photolithographic mask...
- Patent number 7,451,428
- Issue date Nov 11, 2008
- Texas Instruments Incorporated
- Sean C. O'Brien
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and system for contiguous proximity correction for semicondu...
- Patent number 7,341,808
- Issue date Mar 11, 2008
- Texas Instruments Incorporated
- Theodore W. Houston
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of locating sub-resolution assist feature(s)
- Patent number 7,200,835
- Issue date Apr 3, 2007
- Texas Instruments Incorporated
- Guohong Zhang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Characterizing an exposure tool for patterning a wafer
- Patent number 6,847,919
- Issue date Jan 25, 2005
- Texas Instruments Incorporated
- Guohong Zhang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
MERGING SUB-RESOLUTION ASSIST FEATURES OF A PHOTOLITHOGRAPHIC MASK
- Publication number 20120011478
- Publication date Jan 12, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Sean C O'Brien
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Merging Sub-Resolution Assist Features of a Photolithographic Mask
- Publication number 20090029272
- Publication date Jan 29, 2009
- TEXAS INSTRUMENTS INCORPORATED
- Sean C O'Brien
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method of Mapping Lithography Focus Errors
- Publication number 20080176045
- Publication date Jul 24, 2008
- Guohong Zhang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Merging sub-resolution assist features of a photolithographic mask
- Publication number 20060188791
- Publication date Aug 24, 2006
- TEXAS INSTRUMENTS INCORPORATED
- Sean C. O'Brien
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method of locating sub-resolution assist feature(s)
- Publication number 20060190919
- Publication date Aug 24, 2006
- TEXAS INSTRUMENTS INCORPORATED
- Guohong Zhang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and system for contiguous proximity correction for semicondu...
- Publication number 20060019202
- Publication date Jan 26, 2006
- TEXAS INSTRUMENTS INCORPORATED
- Theodore W. Houston
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Characterizing an exposure tool for patterning a wafer
- Publication number 20040167748
- Publication date Aug 26, 2004
- TEXAS INSTRUMENTS INCORPORATED
- Guohong Zhang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Guohong Zhang

Person

Patents Grantslast 30 patents

Merging sub-resolution assist features of a photolithographic mask

Merging sub-resolution assist features of a photolithographic mask

Method of mapping lithography focus errors

Merging sub-resolution assist features of a photolithographic mask...

Method and system for contiguous proximity correction for semicondu...

Method of locating sub-resolution assist feature(s)

Characterizing an exposure tool for patterning a wafer

Patents Applicationslast 30 patents

MERGING SUB-RESOLUTION ASSIST FEATURES OF A PHOTOLITHOGRAPHIC MASK

Merging Sub-Resolution Assist Features of a Photolithographic Mask

Method of Mapping Lithography Focus Errors

Merging sub-resolution assist features of a photolithographic mask

Method of locating sub-resolution assist feature(s)

Method and system for contiguous proximity correction for semicondu...

Characterizing an exposure tool for patterning a wafer