GUOLIANG MAO

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Nanjing, CN

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Patents Grantslast 30 patents

Information Patent Grant
SOC-oriented concurrent test system for multiple clock domains and...
- Patent number 12,130,718
- Issue date Oct 29, 2024
- Macrotest Semiconductor Inc.
- Guoliang Mao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mixed signal test device based on graphical control
- Patent number 12,111,349
- Issue date Oct 8, 2024
- Macrotest Semiconductor Inc.
- Quanren Li
- G01 - MEASURING TESTING
Information Patent Grant
Automatic learning method and system for digital test vector
- Patent number 12,061,529
- Issue date Aug 13, 2024
- Macrotest Semiconductor Inc.
- Wanchao Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-core test processor, and integrated circuit test system and m...
- Patent number 12,044,720
- Issue date Jul 23, 2024
- Macrotest Semiconductor Inc.
- Guoliang Mao
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
UNIVERSAL DETECTION DEVICE AND METHOD FOR HIGH SPEED DIGITAL INTERF...
- Publication number 20250044345
- Publication date Feb 6, 2025
- MACROTEST SEMICONDUCTOR TECHNOLOGY CO., LTD
- Guoliang MAO
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC LEARNING METHOD AND SYSTEM FOR DIGITAL TEST VECTOR
- Publication number 20240248820
- Publication date Jul 25, 2024
- Macrotest Semiconductor Inc.
- Wanchao Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTI-CORE TEST PROCESSOR, AND INTEGRATED CIRCUIT TEST SYSTEM AND M...
- Publication number 20240219451
- Publication date Jul 4, 2024
- Macrotest Semiconductor Inc.
- Guoliang Mao
- G01 - MEASURING TESTING
Information Patent Application
MIXED SIGNAL TEST DEVICE BASED ON GRAPHICAL CONTROL
- Publication number 20240219456
- Publication date Jul 4, 2024
- Macrotest Semiconductor Inc.
- Quanren Li
- G01 - MEASURING TESTING
Information Patent Application
SOC-ORIENTED CONCURRENT TEST SYSTEM FOR MULTIPLE CLOCK DOMAINS AND...
- Publication number 20240220381
- Publication date Jul 4, 2024
- Macrotest Semiconductor Inc.
- Guoliang Mao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAVEFORM MEASURING METHOD
- Publication number 20220187351
- Publication date Jun 16, 2022
- NANJING MACROTEST SEMICONDUCTOE TECHNOLOGY CO., LTD.
- GUOLIANG MAO
- G01 - MEASURING TESTING