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Patent Grant
System and method for performing scan test
Patent number
8,935,584
Issue date
Jan 13, 2015
FREESCALE SEMICONDUCTOR, INC.
Guoping Wan
G11 - INFORMATION STORAGE
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last 30 patents
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Patent Application
SYSTEM AND METHOD FOR PERFORMING SCAN TEST
Publication number
20140032986
Publication date
Jan 30, 2014
Guoping WAN
G01 - MEASURING TESTING