Guray Tas

Person

Flanders, NJ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Temperature control for GaN based materials
- Patent number 9,677,944
- Issue date Jun 13, 2017
- Veeco Instruments Inc.
- Alexander I. Gurary
- G01 - MEASURING TESTING
Information Patent Grant
Heated wafer carrier profiling
- Patent number 9,653,340
- Issue date May 16, 2017
- Veeco Instruments Inc.
- Vadim Boguslavskiy
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Radiation thermometer using off-focus telecentric optics
- Patent number 9,448,119
- Issue date Sep 20, 2016
- Veeco Instruments Inc.
- Guray Tas
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Temperature control for GaN based materials
- Patent number 9,200,965
- Issue date Dec 1, 2015
- Veeco Instruments Inc.
- Alexander I. Gurary
- G01 - MEASURING TESTING
Information Patent Grant
Control of stray radiation in a CVD chamber
- Patent number 9,085,824
- Issue date Jul 21, 2015
- Veeco Instruments, Inc.
- Guray Tas
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Heated wafer carrier profiling
- Patent number 8,958,061
- Issue date Feb 17, 2015
- Veeco Instruments Inc.
- Vadim Boguslavskiy
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Characterization with picosecond ultrasonics of metal portions of s...
- Patent number 8,312,772
- Issue date Nov 20, 2012
- Rudolph Technologies, Inc.
- Guray Tas
- G01 - MEASURING TESTING
Information Patent Grant
Combination of ellipsometry and optical stress generation and detec...
- Patent number 7,903,238
- Issue date Mar 8, 2011
- Rudolph Technologies, Inc.
- Manjusha Mehendale
- G01 - MEASURING TESTING
Information Patent Grant
Measuring elastic moduli of dielectric thin films using an optical...
- Patent number 7,019,845
- Issue date Mar 28, 2006
- Rudolph Technologies, Inc.
- Sean P. Leary
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEMPERATURE CONTROL FOR GaN BASED MATERIALS
- Publication number 20160041037
- Publication date Feb 11, 2016
- VEECO INSTRUMENTS INC.
- Alexander I. Gurary
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE CONTROL FOR GaN BASED MATERIALS
- Publication number 20130343426
- Publication date Dec 26, 2013
- VEECO INSTRUMENTS INC.
- Alexander I. Gurary
- G01 - MEASURING TESTING
Information Patent Application
RADIATION THERMOMETER USING OFF-FOCUS TELECENTRIC OPTICS
- Publication number 20130343425
- Publication date Dec 26, 2013
- Guray Tas
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
CONTROL OF STRAY RADIATION IN A CVD CHAMBER
- Publication number 20130340677
- Publication date Dec 26, 2013
- Guray Tas
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
HEATED WAFER CARRIER PROFILING
- Publication number 20120307233
- Publication date Dec 6, 2012
- VEECO INSTRUMENTS INC.
- Vadim Boguslavskiy
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
HEATED WAFER CARRIER PROFILING
- Publication number 20120304926
- Publication date Dec 6, 2012
- VEECO INSTRUMENTS INC.
- Vadim Boguslavskiy
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
CHARACTERIZATION WITH PICOSECOND ULTRASONICS OF METAL PORTIONS OF S...
- Publication number 20100281981
- Publication date Nov 11, 2010
- Guray Tas
- G01 - MEASURING TESTING
Information Patent Application
Combination of ellipsometry and optical stress generation and detec...
- Publication number 20090244516
- Publication date Oct 1, 2009
- Manjusha Mehendale
- G01 - MEASURING TESTING
Information Patent Application
MEASURING ELASTIC MODULI OF DIELECTRIC THIN FILMS USING AN OPTICAL...
- Publication number 20060072120
- Publication date Apr 6, 2006
- Rudolph Technologies, Inc.
- Sean P. Leary
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Temperature control for GaN based materials

Heated wafer carrier profiling

Radiation thermometer using off-focus telecentric optics

Temperature control for GaN based materials

Control of stray radiation in a CVD chamber

Heated wafer carrier profiling

Characterization with picosecond ultrasonics of metal portions of s...

Combination of ellipsometry and optical stress generation and detec...

Measuring elastic moduli of dielectric thin films using an optical...

Patents Applicationslast 30 patents

TEMPERATURE CONTROL FOR GaN BASED MATERIALS

TEMPERATURE CONTROL FOR GaN BASED MATERIALS

RADIATION THERMOMETER USING OFF-FOCUS TELECENTRIC OPTICS

CONTROL OF STRAY RADIATION IN A CVD CHAMBER

HEATED WAFER CARRIER PROFILING

HEATED WAFER CARRIER PROFILING

CHARACTERIZATION WITH PICOSECOND ULTRASONICS OF METAL PORTIONS OF S...

Combination of ellipsometry and optical stress generation and detec...

MEASURING ELASTIC MODULI OF DIELECTRIC THIN FILMS USING AN OPTICAL...