Gustaaf Verhaegen

Person

Putte, BE

People

Patents Grantslast 30 patents

Information Patent Grant
Optimization
- Patent number 8,136,078
- Issue date Mar 13, 2012
- IMEC
- Axel Nackaerts
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device for measuring an overlay error, method for mea...
- Patent number 7,786,477
- Issue date Aug 31, 2010
- ASML Netherlands B.V.
- Mircea Dusa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device for measuring an overlay error, method for mea...
- Patent number 7,704,850
- Issue date Apr 27, 2010
- ASML Netherlands B.V.
- Mircea Dusa
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Methods for Manufacturing Dense Integrated Circuits
- Publication number 20110084313
- Publication date Apr 14, 2011
- IMEC
- Liesbeth Witters
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR MASK DESIGN FOR DOUBLE PATTERNING
- Publication number 20090217224
- Publication date Aug 27, 2009
- Interuniversitair Microelektronica Centrum vzw (IMEC)
- Vincent Jean-Marie Pierre Paul Wiaux
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
DESIGN OPTIMIZATION
- Publication number 20090112344
- Publication date Apr 30, 2009
- Interuniversitair Microelektronica Centrum vzw (IMEC)
- Axel Nackaerts
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor device for measuring an overlay error, method for mea...
- Publication number 20080149925
- Publication date Jun 26, 2008
- ASML NETHERLANDS B.V.
- Mircea Dusa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Semiconductor device for measuring an overlay error, method for mea...
- Publication number 20080061291
- Publication date Mar 13, 2008
- ASML NETHERLANDS B.V.
- Mircea Dusa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Methods for manufacturing dense integrated circuits
- Publication number 20070172770
- Publication date Jul 26, 2007
- Liesbeth Witters
- H01 - BASIC ELECTRIC ELEMENTS

Gustaaf Verhaegen

Person

Patents Grantslast 30 patents

Optimization

Semiconductor device for measuring an overlay error, method for mea...

Semiconductor device for measuring an overlay error, method for mea...

Patents Applicationslast 30 patents

Methods for Manufacturing Dense Integrated Circuits

METHOD AND SYSTEM FOR MASK DESIGN FOR DOUBLE PATTERNING

DESIGN OPTIMIZATION

Semiconductor device for measuring an overlay error, method for mea...

Semiconductor device for measuring an overlay error, method for mea...

Methods for manufacturing dense integrated circuits