Guy Ben-Zvi

Person

Har Halutz, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Analyses of measurement data
- Patent number 9,207,530
- Issue date Dec 8, 2015
- Carl Zeiss SMS Ltd
- Vladimir Dmitriev
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Critical dimension uniformity correction by scanner signature control
- Patent number 9,134,112
- Issue date Sep 15, 2015
- Carl Zeiss SMS Ltd
- Ofir Sharoni
- G01 - MEASURING TESTING
Information Patent Grant
Controllable transmission and phase compensation of transparent mat...
- Patent number 9,034,539
- Issue date May 19, 2015
- Carl Zeiss SMS GmbH
- Sergey Oshemkov
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Grant
Lithographic targets for uniformity control
- Patent number 8,871,409
- Issue date Oct 28, 2014
- Carl Zeiss SMS Ltd
- Rainer Pforr
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for DUV transmission mapping
- Patent number 8,592,770
- Issue date Nov 26, 2013
- Carl Zeiss SMS Ltd
- Guy Ben-Zvi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for mapping of line-width size distributions o...
- Patent number 8,421,026
- Issue date Apr 16, 2013
- Carl Zeiss SMS Ltd
- Guy Ben-Zvi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for correcting critical dimension variations in photomasks
- Patent number 7,736,819
- Issue date Jun 15, 2010
- Pixer Technology Ltd.
- Eitan Zait
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and system for repairing defected photomasks
- Patent number 7,459,242
- Issue date Dec 2, 2008
- Pixer Technology Ltd.
- Eitan Zait
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
LITHOGRAPHIC TARGETS FOR UNIFORMITY CONTROL
- Publication number 20130295698
- Publication date Nov 7, 2013
- Rainer Pforr
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTROLLABLE TRANSMISSION AND PHASE COMPENSATION OF TRANSPARENT MAT...
- Publication number 20130209926
- Publication date Aug 15, 2013
- Sergey Oshemkov
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Application
CRITICAL DIMENSION UNIFORMITY CORRECTION BY SCANNER SIGNATURE CONTROL
- Publication number 20130077101
- Publication date Mar 28, 2013
- Ofir Sharoni
- G01 - MEASURING TESTING
Information Patent Application
ANALYSES OF MEASUREMENT DATA
- Publication number 20130028505
- Publication date Jan 31, 2013
- Vladimir Dmitriev
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS FOR MAPPING OF LINE-WIDTH SIZE DISTRIBUTIONS O...
- Publication number 20110122395
- Publication date May 26, 2011
- Guy Ben-Zvi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS FOR DUV TRANSMISSION MAPPING
- Publication number 20110101226
- Publication date May 5, 2011
- Guy Ben-Zvi
- G01 - MEASURING TESTING
Information Patent Application
Subsurface Reticle
- Publication number 20080165406
- Publication date Jul 10, 2008
- Ehud Galun
- G02 - OPTICS
Information Patent Application
Method for correcting critical dimension variations in photomasks
- Publication number 20070065729
- Publication date Mar 22, 2007
- Eitan Zait
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and system for reparing defected photomasks
- Publication number 20050084767
- Publication date Apr 21, 2005
- Eitan Zait
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Guy Ben-Zvi

Person

Patents Grantslast 30 patents

Analyses of measurement data

Critical dimension uniformity correction by scanner signature control

Controllable transmission and phase compensation of transparent mat...

Lithographic targets for uniformity control

Method and apparatus for DUV transmission mapping

Method and apparatus for mapping of line-width size distributions o...

Method for correcting critical dimension variations in photomasks

Method and system for repairing defected photomasks

Patents Applicationslast 30 patents

LITHOGRAPHIC TARGETS FOR UNIFORMITY CONTROL

CONTROLLABLE TRANSMISSION AND PHASE COMPENSATION OF TRANSPARENT MAT...

CRITICAL DIMENSION UNIFORMITY CORRECTION BY SCANNER SIGNATURE CONTROL

ANALYSES OF MEASUREMENT DATA

METHOD AND APPARATUS FOR MAPPING OF LINE-WIDTH SIZE DISTRIBUTIONS O...

METHOD AND APPARATUS FOR DUV TRANSMISSION MAPPING

Subsurface Reticle

Method for correcting critical dimension variations in photomasks

Method and system for reparing defected photomasks