Guy Eytan

Person

Kidron, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Lateral recess measurement in a semiconductor specimen
- Patent number 11,921,063
- Issue date Mar 5, 2024
- Applied Materials Israel Ltd.
- Michael Chemama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reactive particles supply system
- Patent number 11,810,765
- Issue date Nov 7, 2023
- Applied Materials Israel Ltd.
- Asaf Gutman
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Evaluating a contact between a wafer and an electrostatic chuck
- Patent number 11,694,869
- Issue date Jul 4, 2023
- Applied Materials Israel Ltd.
- Adam Faust
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sensor for electron detection
- Patent number 11,355,309
- Issue date Jun 7, 2022
- Applied Materials Israel Ltd.
- Itay Assulin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Generating three dimensional information regarding structural eleme...
- Patent number 11,264,202
- Issue date Mar 1, 2022
- Applied Materials Israel Ltd.
- Konstantin Chirko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam source and a method for assembling a charged...
- Patent number 11,189,451
- Issue date Nov 30, 2021
- Applied Materials Israel Ltd.
- Itay Asulin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cleanliness monitor and a method for monitoring a cleanliness of a...
- Patent number 11,049,704
- Issue date Jun 29, 2021
- Applied Materials Israel Ltd.
- Irit Ruach-Nir
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cleanliness monitor and a method for monitoring a cleanliness of a...
- Patent number 10,910,204
- Issue date Feb 2, 2021
- Applied Materials Israel Ltd.
- Irit Ruach-Nir
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam source and a method for assembling a charged...
- Patent number 10,886,092
- Issue date Jan 5, 2021
- Applied Materials Israel Ltd.
- Itay Asulin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System, computer program product, and method for dissipation of an...
- Patent number 10,716,197
- Issue date Jul 14, 2020
- Applied Materials Israel Ltd.
- Guy Eytan
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device, charged particle beam influencing dev...
- Patent number 10,249,472
- Issue date Apr 2, 2019
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Dieter Winkler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cleanliness monitor and a method for monitoring a cleanliness of a...
- Patent number 10,217,621
- Issue date Feb 26, 2019
- Applied Materials Israel Ltd.
- Irit Ruach-Nir
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic chuck and a method for supporting a wafer
- Patent number 8,804,299
- Issue date Aug 12, 2014
- Applied Materials Israel, Ltd.
- Guy Eytan
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
LATERAL RECESS MEASUREMENT IN A SEMICONDUCTOR SPECIMEN
- Publication number 20230023363
- Publication date Jan 26, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Michael CHEMAMA
- G01 - MEASURING TESTING
Information Patent Application
REACTIVE PARTICLES SUPPLY SYSTEM
- Publication number 20220199370
- Publication date Jun 23, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Asaf Gutman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EVALUATING A CONTACT BETWEEN A WAFER AND AN ELECTROSTATIC CHUCK
- Publication number 20220181115
- Publication date Jun 9, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Adam Faust
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GENERATING THREE DIMENSIONAL INFORMATION REGARDING STRUCTURAL ELEME...
- Publication number 20210358712
- Publication date Nov 18, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Konstantin Chirko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SENSOR FOR ELECTRON DETECTION
- Publication number 20210319976
- Publication date Oct 14, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Itay Assulin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM SOURCE AND A METHOD FOR ASSEMBLING A CHARGED...
- Publication number 20210175040
- Publication date Jun 10, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Itay Asulin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM SOURCE AND A METHOD FOR ASSEMBLING A CHARGED...
- Publication number 20200234907
- Publication date Jul 23, 2020
- APPLIED MATERIALS ISRAEL LTD.
- Itay Asulin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CLEANLINESS MONITOR AND A METHOD FOR MONITORING A CLEANLINESS OF A...
- Publication number 20200013603
- Publication date Jan 9, 2020
- APPLIED MATERIALS ISRAEL LTD.
- Irit RUACH-NIR
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM, COMPUTER PROGRAM PRODUCT, AND METHOD FOR DISSIPATION OF AN...
- Publication number 20190090335
- Publication date Mar 21, 2019
- APPLIED MATERIALS ISRAEL LTD.
- Guy Eytan
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
CLEANLINESS MONITOR AND A METHOD FOR MONITORING A CLEANLINESS OF A...
- Publication number 20190027354
- Publication date Jan 24, 2019
- APPLIED MATERIALS ISRAEL LTD.
- Irit RUACH-NIR
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE, CHARGED PARTICLE BEAM INFLUENCING DEV...
- Publication number 20190019649
- Publication date Jan 17, 2019
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Dieter Winkler
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Lateral recess measurement in a semiconductor specimen

Reactive particles supply system

Evaluating a contact between a wafer and an electrostatic chuck

Sensor for electron detection

Generating three dimensional information regarding structural eleme...

Charged particle beam source and a method for assembling a charged...

Cleanliness monitor and a method for monitoring a cleanliness of a...

Cleanliness monitor and a method for monitoring a cleanliness of a...

Charged particle beam source and a method for assembling a charged...

System, computer program product, and method for dissipation of an...

Charged particle beam device, charged particle beam influencing dev...

Cleanliness monitor and a method for monitoring a cleanliness of a...

Electrostatic chuck and a method for supporting a wafer

Patents Applicationslast 30 patents

LATERAL RECESS MEASUREMENT IN A SEMICONDUCTOR SPECIMEN

REACTIVE PARTICLES SUPPLY SYSTEM

EVALUATING A CONTACT BETWEEN A WAFER AND AN ELECTROSTATIC CHUCK

GENERATING THREE DIMENSIONAL INFORMATION REGARDING STRUCTURAL ELEME...

SENSOR FOR ELECTRON DETECTION

CHARGED PARTICLE BEAM SOURCE AND A METHOD FOR ASSEMBLING A CHARGED...

CHARGED PARTICLE BEAM SOURCE AND A METHOD FOR ASSEMBLING A CHARGED...

CLEANLINESS MONITOR AND A METHOD FOR MONITORING A CLEANLINESS OF A...

SYSTEM, COMPUTER PROGRAM PRODUCT, AND METHOD FOR DISSIPATION OF AN...

CLEANLINESS MONITOR AND A METHOD FOR MONITORING A CLEANLINESS OF A...

CHARGED PARTICLE BEAM DEVICE, CHARGED PARTICLE BEAM INFLUENCING DEV...