Guy Kafry

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Atzmon, IL

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Patents Grantslast 30 patents

Information Patent Grant
System for inspecting a backside of a wafer
- Patent number 10,215,707
- Issue date Feb 26, 2019
- CAMTEK LTD.
- Zehava Ben Ezer
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM FOR INSPECTING A BACKSIDE OF A WAFER
- Publication number 20170010220
- Publication date Jan 12, 2017
- Camtek LTD.
- Zehava Ben Ezer
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MAINTAINING OPTICS IN FOCUS
- Publication number 20140327906
- Publication date Nov 6, 2014
- CAMTEK LTD
- Guy Kafry
- G02 - OPTICS