Guy Sheaffer

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Haifa, IL

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Patents Grantslast 30 patents

Information Patent Grant
Wafer alignment for small-angle x-ray scatterometry
- Patent number 10,976,269
- Issue date Apr 13, 2021
- BRUKER TECHNOLOGIES LTD.
- Yuri Vinshtein
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Wafer alignment for small-angle X-ray scatterometry
- Publication number 20190323976
- Publication date Oct 24, 2019
- BRUKER JV ISRAEL LTD.
- Yuri Vinshtein
- G01 - MEASURING TESTING