Gyeongseop Kim

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Suwon-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device having a plurality of fins and method of fabri...
- Patent number 10,991,692
- Issue date Apr 27, 2021
- Samsung Electronics Co., Ltd.
- Myoung Ho Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for measuring pattern placement error on a wafer
- Patent number 10,748,821
- Issue date Aug 18, 2020
- Samsung Electronics Co., Ltd.
- Gyeongseop Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device having first and second fin-type patterns and...
- Patent number 10,643,998
- Issue date May 5, 2020
- Samsung Electronics Co., Ltd.
- Myoung Ho Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having first and second fin-type patterns and...
- Patent number 10,475,789
- Issue date Nov 12, 2019
- Samsung Electroncis Co., Ltd.
- Myoung Ho Kang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE HAVING FIRST AND SECOND FIN-TYPE PATTERNS AND...
- Publication number 20200235097
- Publication date Jul 23, 2020
- Samsung Electronics Co., Ltd.
- Myoung Ho Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE HAVING FIRST AND SECOND FIN-TYPE PATTERNS AND...
- Publication number 20200043922
- Publication date Feb 6, 2020
- Samsung Electronics Co., Ltd.
- Myoung Ho Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR MEASURING PATTERN PLACEMENT ERROR ON A WAFER
- Publication number 20180315671
- Publication date Nov 1, 2018
- Samsung Electronics Co., Ltd.
- GYEONGSEOP KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
- Publication number 20180286859
- Publication date Oct 4, 2018
- Samsung Electronics Co., Ltd.
- Myoung Ho Kang
- H01 - BASIC ELECTRIC ELEMENTS