Gyokubu CHO

Person

Kanagawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Position specifying method and program
- Patent number 12,210,722
- Issue date Jan 28, 2025
- Mitutoyo Corporation
- Gyokubu Cho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Position specifying method and program
- Patent number 11,656,733
- Issue date May 23, 2023
- Mitutoyo Corporation
- Gyokubu Cho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Position specifying method and program
- Patent number 11,314,374
- Issue date Apr 26, 2022
- Mitutoyo Corporation
- Gyokubu Cho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image measuring method and apparatus
- Patent number 11,257,205
- Issue date Feb 22, 2022
- Mitutoyo Corporation
- Gyokubu Cho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Variable focal length lens device and variable focal length lens co...
- Patent number 11,215,788
- Issue date Jan 4, 2022
- Mitutoyo Corporation
- Hiroshi Sakai
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for generating measurement plan for measuring...
- Patent number 11,037,337
- Issue date Jun 15, 2021
- Mitutoyo Corporation
- Kozo Ariga
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray CT measuring apparatus and interference prevention method the...
- Patent number 10,753,887
- Issue date Aug 25, 2020
- Mitutoyo Corporation
- Kozo Ariga
- G01 - MEASURING TESTING
Information Patent Grant
Position specifying method and program
- Patent number 10,656,780
- Issue date May 19, 2020
- Mitutoyo Corporation
- Gyokubu Cho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Imaging system and imaging method
- Patent number 10,642,017
- Issue date May 5, 2020
- Mitutoyo Corporation
- Gyokubu Cho
- G02 - OPTICS
Information Patent Grant
Object-forming machine, cross-section measurement apparatus, and cr...
- Patent number 10,618,220
- Issue date Apr 14, 2020
- Mitutoyo Corporation
- Gyokubu Cho
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Object-forming machine, cross-section measurement apparatus, and cr...
- Patent number 10,343,334
- Issue date Jul 9, 2019
- Mitutoyo Corporation
- Gyokubu Cho
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Edge detection bias correction value calculation method, edge detec...
- Patent number 10,102,631
- Issue date Oct 16, 2018
- Mitutoyo Corporation
- Hiroyuki Yoshida
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image measuring apparatus
- Patent number 10,027,885
- Issue date Jul 17, 2018
- Mitutoyo Corporation
- Gyokubu Cho
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Light interference measuring device and program therefor
- Patent number 9,726,473
- Issue date Aug 8, 2017
- Mitutoyo Corporation
- Kenji Okabe
- G01 - MEASURING TESTING
Information Patent Grant
Machine vision system program editing environment including real ti...
- Patent number 8,957,960
- Issue date Feb 17, 2015
- Mitutoyo Corporation
- Barry Saylor
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
POSITION SPECIFYING METHOD AND PROGRAM
- Publication number 20230251753
- Publication date Aug 10, 2023
- Mitutoyo Corporation
- Gyokubu Cho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POSITION SPECIFYING METHOD AND PROGRAM
- Publication number 20220221974
- Publication date Jul 14, 2022
- Mitutoyo Corporation
- Gyokubu Cho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POSITION SPECIFYING METHOD AND PROGRAM
- Publication number 20210255755
- Publication date Aug 19, 2021
- Mitutoyo Corporation
- Gyokubu Cho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POSITION SPECIFYING METHOD AND PROGRAM
- Publication number 20200210049
- Publication date Jul 2, 2020
- Mitutoyo Corporation
- Gyokubu Cho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VARIABLE FOCAL LENGTH LENS DEVICE AND VARIABLE FOCAL LENGTH LENS CO...
- Publication number 20190353872
- Publication date Nov 21, 2019
- MITUTOYO CORPORATION
- Hiroshi SAKAI
- G02 - OPTICS
Information Patent Application
METHOD AND APPARATUS FOR GENERATING MEASUREMENT PLAN FOR MEASURING...
- Publication number 20190287274
- Publication date Sep 19, 2019
- MITUTOYO CORPORATION
- Kozo ARIGA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OBJECT-FORMING MACHINE, CROSS-SECTION MEASUREMENT APPARATUS, AND CR...
- Publication number 20190255776
- Publication date Aug 22, 2019
- Mitutoyo Corporation
- Gyokubu CHO
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
X-RAY CT MEASURING APPARATUS AND INTERFERENCE PREVENTION METHOD THE...
- Publication number 20190227004
- Publication date Jul 25, 2019
- MITUTOYO CORPORATION
- Kozo ARIGA
- G01 - MEASURING TESTING
Information Patent Application
IMAGE MEASUREMENT APPARATUS AND COMPUTER READABLE MEDIUM
- Publication number 20190220185
- Publication date Jul 18, 2019
- Mitutoyo Corporation
- Gyokubu Cho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POSITION SPECIFYING METHOD AND PROGRAM
- Publication number 20190220167
- Publication date Jul 18, 2019
- Mitutoyo Corporation
- Gyokubu Cho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGING SYSTEM AND IMAGING METHOD
- Publication number 20170285318
- Publication date Oct 5, 2017
- MITUTOYO CORPORATION
- Gyokubu CHO
- G02 - OPTICS
Information Patent Application
IMAGE MEASURING METHOD AND IMAGE MEASURING DEVICE
- Publication number 20170178315
- Publication date Jun 22, 2017
- MITUTOYO CORPORATION
- Gyokubu CHO
- G01 - MEASURING TESTING
Information Patent Application
OBJECT-FORMING MACHINE, CROSS-SECTION MEASUREMENT APPARATUS, AND CR...
- Publication number 20160375640
- Publication date Dec 29, 2016
- Mitutoyo Corporation
- Gyokubu CHO
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Application
EDGE DETECTION BIAS CORRECTION VALUE CALCULATION METHOD, EDGE DETEC...
- Publication number 20160295207
- Publication date Oct 6, 2016
- MITUTOYO CORPORATION
- Hiroyuki YOSHIDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE MEASURING APPARATUS
- Publication number 20160019687
- Publication date Jan 21, 2016
- MITUTOYO CORPORATION
- Gyokubu CHO
- G02 - OPTICS
Information Patent Application
IMAGE MEASURING APPARATUS
- Publication number 20160021306
- Publication date Jan 21, 2016
- MITUTOYO CORPORATION
- Gyokubu CHO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LIGHT INTERFERENCE MEASURING DEVICE AND PROGRAM THEREFOR
- Publication number 20150176967
- Publication date Jun 25, 2015
- Mitutoyo Corporation
- Kenji Okabe
- G01 - MEASURING TESTING
Information Patent Application
MACHINE VISION SYSTEM PROGRAM EDITING ENVIRONMENT INCLUDING REAL TI...
- Publication number 20130123945
- Publication date May 16, 2013
- Mitutoyo Corporation
- Barry Saylor
- G01 - MEASURING TESTING
Information Patent Application
Optical measuring instrument
- Publication number 20090303068
- Publication date Dec 10, 2009
- Mitutoyo Corporation
- Masanori Arai
- G01 - MEASURING TESTING

Gyokubu CHO

Person

Patents Grantslast 30 patents

Position specifying method and program

Position specifying method and program

Position specifying method and program

Image measuring method and apparatus

Variable focal length lens device and variable focal length lens co...

Method and apparatus for generating measurement plan for measuring...

X-ray CT measuring apparatus and interference prevention method the...

Position specifying method and program

Imaging system and imaging method

Object-forming machine, cross-section measurement apparatus, and cr...

Object-forming machine, cross-section measurement apparatus, and cr...

Edge detection bias correction value calculation method, edge detec...

Image measuring apparatus

Light interference measuring device and program therefor

Machine vision system program editing environment including real ti...

Patents Applicationslast 30 patents

POSITION SPECIFYING METHOD AND PROGRAM

POSITION SPECIFYING METHOD AND PROGRAM

POSITION SPECIFYING METHOD AND PROGRAM

POSITION SPECIFYING METHOD AND PROGRAM

VARIABLE FOCAL LENGTH LENS DEVICE AND VARIABLE FOCAL LENGTH LENS CO...

METHOD AND APPARATUS FOR GENERATING MEASUREMENT PLAN FOR MEASURING...

OBJECT-FORMING MACHINE, CROSS-SECTION MEASUREMENT APPARATUS, AND CR...

X-RAY CT MEASURING APPARATUS AND INTERFERENCE PREVENTION METHOD THE...

IMAGE MEASUREMENT APPARATUS AND COMPUTER READABLE MEDIUM

POSITION SPECIFYING METHOD AND PROGRAM

IMAGING SYSTEM AND IMAGING METHOD

IMAGE MEASURING METHOD AND IMAGE MEASURING DEVICE

OBJECT-FORMING MACHINE, CROSS-SECTION MEASUREMENT APPARATUS, AND CR...

EDGE DETECTION BIAS CORRECTION VALUE CALCULATION METHOD, EDGE DETEC...

IMAGE MEASURING APPARATUS

IMAGE MEASURING APPARATUS

LIGHT INTERFERENCE MEASURING DEVICE AND PROGRAM THEREFOR

MACHINE VISION SYSTEM PROGRAM EDITING ENVIRONMENT INCLUDING REAL TI...

Optical measuring instrument